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PDF HCPL-0500 Data sheet ( Hoja de datos )

Número de pieza HCPL-0500
Descripción SINGLE CHANNEL HIGH SPEED TRANSISTOR OPTOCOUPLERS
Fabricantes Fairchild Semiconductor 
Logotipo Fairchild Semiconductor Logotipo



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No Preview Available ! HCPL-0500 Hoja de datos, Descripción, Manual

SINGLE CHANNEL HIGH SPEED
TRANSISTOR OPTOCOUPLERS
HCPL-0452
HCPL-0500
HCPL-0501
DESCRIPTION
The HCPL-0500, HCPL-0501 and HCPL-0452 optocouplers consist of an AlGaAs LED optically coupled to a high speed
photodetector transistor housed in a compact 8-pin smalloutline package.
A separate connection for the bias of the photodiode improves the speed by several orders of magnitude over conventional
phototransistor optocouplers by reducing the base-collector capacitance of the input transistor.
FEATURES
• High speed-1 MBit/s
• Superior CMR-1 kV/µs
• CTR guaranteed 0-70°C
• U.L. recognized (File # E90700)
PACKAGE DIMENSIONS
APPLICATIONS
• Line receivers
• Pulse transformer replacement
• Output interface to
CMOS-LSTTL-TTL
• Wide bandwidth analog
coupling
0.164 (4.16)
0.144 (3.66)
N/C 1
+2
V
F
_3
N/C 4
8
V
CC
7
V*
B
6V
O
5 GND
Pin 1
0.202 (5.13)
0.182 (4.63)
0.143 (3.63)
0.123 (3.13)
0.019 (0.48)
0.010 (0.25)
0.006 (0.16)
0.021 (0.53)
0.011 (0.28)
0.008 (0.20)
0.003 (0.08)
0.050 (1.27)
TYP
0.244 (6.19)
0.224 (5.69)
Lead Coplanarity : 0.004 (0.10) MAX
HCPL-0500, HCPL-0501
*BASE NOT CONNECTED
FOR HCPL-0452
NOTE
All dimensions are in inches (millimeters)
© 2003 Fairchild Semiconductor Corporation
Page 1 of 11
8/18/03

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HCPL-0500 pdf
SINGLE CHANNEL HIGH SPEED
TRANSISTOR OPTOCOUPLERS
HCPL-0452
HCPL-0500
HCPL-0501
NOTES
1. Derate linearly above 70°C free-air temperature at a rate of 0.8 mA/°C.
2. Derate linearly above 70°C free-air temperature at a rate of 1.6 mA/°C.
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C.
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C.
5. Current Transfer Ratio is defined as a ratio of output collector current, IO, to the forward LED input current, IF, times 100%.
6. The 4.1 kload represents 1 LSTTL unit load of 0.36 mA and 6.1kpull-up resistor.
7. The 1.9 kload represents 1 TTL unit load of 1.6 mA and 5.6 kpull-up resistor.
8. Common mode transient immunity in logic high level is the maximum tolerable (positive) dVcm/dt on the leading edge of the
common mode pulse signal VCM, to assure that the output will remain in a logic high state (i.e., VO>2.0 V). Common mode tran-
sient immunity in logic low level is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common mode pulse
signal, VCM, to assure that the output will remain in a logic low state (i.e., VO<0.8 V).
9. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted together.
10. 2500 VAC RMS for 1 minute duration is equivalent to 3000 VAC RMS for 1 second duration.
© 2003 Fairchild Semiconductor Corporation
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8/18/03

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HCPL-0500 arduino
SINGLE CHANNEL HIGH SPEED
TRANSISTOR OPTOCOUPLERS
HCPL-0452
HCPL-0500
HCPL-0501
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
© 2003 Fairchild Semiconductor Corporation
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8/18/03

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