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PDF SZNUP2105L Data sheet ( Hoja de datos )

Número de pieza SZNUP2105L
Descripción Dual Line CAN Bus Protector
Fabricantes ON Semiconductor 
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NUP2105L, SZNUP2105L
Dual Line CAN
Bus Protector
The SZ/NUP2105L has been designed to protect the CAN
transceiver in highspeed and fault tolerant networks from ESD and
other harmful transient voltage events. This device provides
bidirectional protection for each data line with a single compact
SOT23 package, giving the system designer a low cost option for
improving system reliability and meeting stringent EMI requirements.
Features
350 W Peak Power Dissipation per Line (8 x 20 msec Waveform)
Low Reverse Leakage Current (< 100 nA)
Low Capacitance HighSpeed CAN Data Rates
IEC Compatibility: IEC 6100042 (ESD): Level 4
IEC 6100044 (EFT): 40 A – 5/50 ns
IEC 6100045 (Lighting) 8.0 A (8/20 ms)
ISO 76371, Nonrepetitive EMI Surge Pulse 2, 9.5 A
(1 x 50 ms)
ISO 76373, Repetitive Electrical Fast Transient (EFT)
EMI Surge Pulses, 50 A (5 x 50 ns)
Flammability Rating UL 94 V0
AECQ101 Qualified and PPAP Capable
SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements
PbFree Packages are Available*
Applications
Industrial Control Networks
Smart Distribution Systems (SDS)
DeviceNet
Automotive Networks
Low and HighSpeed CAN
Fault Tolerant CAN
http://onsemi.com
SOT23
DUAL BIDIRECTIONAL
VOLTAGE SUPPRESSOR
350 W PEAK POWER
SOT23
CASE 318
STYLE 27
PIN 1
PIN 2
PIN 3
CAN
Transceiver
CAN_H
CAN_L
CAN Bus
NUP2105L
MARKING DIAGRAM
27EMG
G
1
27E = Device Code
M = Date Code
G = PbFree Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
*For additional information on our PbFree strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
Semiconductor Components Industries, LLC, 2012
January, 2012 Rev. 5
1
Publication Order Number:
NUP2105L/D

1 page




SZNUP2105L pdf
NUP2105L, SZNUP2105L
EMI Specifications
The EMI protection level provided by the TVS device can
be measured using the International Organization for
Standardization (ISO) 76371 and 3 specifications that are
representative of various noise sources. The ISO 76371
specification is used to define the susceptibility to coupled
transient noise on a 12 V power supply, while ISO 76373
defines the noise immunity tests for data lines. The ISO 7637
tests also verify the robustness and reliability of a design by
applying the surge voltage for extended durations.
The IEC 610004X specifications can also be used to
quantify the EMI immunity level of a CAN system. The IEC
610004 and ISO 7637 tests are similar; however, the IEC
standard was created as a generic test for any electronic
system, while the ISO 7637 standard was designed for
vehicular applications. The IEC6100044 Electrical Fast
Transient (EFT) specification is similar to the ISO 76371
pulse 1 and 2 tests and is a requirement of SDS CAN
systems. The IEC 6100045 test is used to define the power
absorption capacity of a TVS device and long duration
voltage transients such as lightning. Table 2 provides a
summary of the ISO 7637 and IEC 610004X test
specifications. Table 3 provides the NUP2105L’s ESD
test results.
Table 2. ISO 7637 and IEC 610004X Test Specifications
Test
Waveform
Test Specifications
NUP2105L Test
Simulated Noise Source
ISO 76371
Pulse 1
Vs = 0 to 100 V
Imax = 10 A
tduration = 5000 pulses
Imax = 1.75 A
Vclamp_max = 31 V
tduration = 5000 pulses
Ri = 10 W, tr = 1.0 ms,
td_10% = 2000 ms, t1 = 2.5 s,
t2 = 200 ms, t3 = 100 ms
DUT in parallel with
inductive load that is
disconnected from power
supply.
12 V Power Supply Lines
Pulse 2
Vs = 0 to +100 V
Imax = 10 A
tduration = 5000 pulses
Imax = 9.5 A
Vclamp_max = 33 V
tduration = 5000 pulses
Ri = 10 W, tr = 1.0 ms,
td_10% = 50 ms, t1 = 2.5 s,
t2 = 200 ms
DUT in series with inductor
that is disconnected.
ISO 76373
Data Line EFT
Pulse ‘a’
Pulse ‘b’
Vs = 60 V
Imax = 1.2 A
tduration = 10 minutes
Vs = +40 V
Imax = 0.8 A
VclaImmpa_xm=a5x 0=
A
40
V
tduration = 60 minutes
Ri = 50 W, tr = 5.0 ns,
td_10% = 0.1 ms, t1 = 100 ms,
t2 = 10 ms, t3 = 90 ms
Switching noise of inductive
loads.
tduration = 10 minutes
IEC 6100044
Vopen circuit = 2.0 kV
Ishort circuit = 40 A
(Level 4 = Severe Industrial
Environment)
(Note 2)
Switching noise of inductive
loads.
Data Line EFT
Ri = 50 W, tr < 5.0 ns,
td_50% = 50 ns, tburst = 15 ms,
fburst = 2.0 to 5.0 kHz,
trepeat = 300 ms
tduration = 1 minute
IEC 6100045
Vopen circuit = 1.2 x 50 ms,
Ishort circuit = 8 x 20 ms
Ri = 50 W
Lightning, nonrepetitive
power line and load
switching
1. DUT = device under test.
2. The EFT immunity level was measured with test limits beyond the IEC 6100044 test, but with the more severe test conditions of
ISO 76373.
Table 3. NUP2105L ESD Test Results
ESD Specification
Test
Human Body Model
Contact
IEC 6100042
Contact
Noncontact (Air Discharge)
3. Test equipment maximum test voltage is 30 kV.
Test Level
16 kV
30 kV (Note 3)
30 kV (Note 3)
Pass
Pass
Pass
Pass / Fail
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