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PDF 2128E Data sheet ( Hoja de datos )

Número de pieza 2128E
Descripción In-SystemProgrammableSuperFASTHighDensityPLD
Fabricantes LatticeSemiconductor 
Logotipo LatticeSemiconductor Logotipo



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ispLSI® 2128E
In-System Programmable
SuperFAST™ High Density PLD
Features
Functional Block Diagram
• SUPERFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
Output Routing Pool (ORP)
Output Routing Pool (ORP)
— 6000 PLD Gates
D7 D6 D5 D4 D3 D2 D1 D0
— 128 I/O Pins, Eight Dedicated Inputs
A0
C7
— 128 Registers
— High Speed Global Interconnect
A1
C6
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
A2
DQ
C5
— Small Logic Block Size for Random Logic
— 100% Functional/JEDEC Upward Compatible with
ispLSI 2128 Devices
A3
A4
Logic
Array
DQ
DQ
GLB
C4
C3
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
fmax = 180 MHz Maximum Operating Frequency
tpd = 5.0 ns Propagation Delay
A5
A6
DQ
C2
C1
— TTL Compatible Inputs and Outputs
— 5V Programmable Logic Core
A7 Global Routing Pool (GRP) C0
— ispJTAG™ In-System Programmable via IEEE 1149.1
B0 B1 B2 B3 B4 B5 B6 B7
(JTAG) Test Access Port
— User-Selectable 3.3V or 5V I/O Supports Mixed-
Output Routing Pool (ORP)
Output Routing Pool (ORP)
Voltage Systems
0139(9A)/2128
— PCI Compatible Outputs
— Open-Drain Output Option
Description
— Electrically Erasable and Reprogrammable
— Non-Volatile
— Unused Product Term Shutdown Saves Power
The ispLSI 2128E is a High Density Programmable Logic
Device. The device contains 128 Registers, 128 Univer-
• ispLSI OFFERS THE FOLLOWING ADDED FEATURES
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY
OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs
sal I/O pins, eight Dedicated Input pins, three Dedicated
Clock Input pins, two dedicated Global OE input pins and
a Global Routing Pool (GRP). The GRP provides com-
plete interconnectivity between all of these elements.
The ispLSI 2128E features 5V in-system programmabil-
ity and in-system diagnostic capabilities. The ispLSI
2128E offers non-volatile reprogrammability of all logic,
as well as the interconnect to provide truly reconfigurable
systems.
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control to
Minimize Switching Noise
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COM-
PLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
The basic unit of logic on the ispLSI 2128E device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see Figure 1). There are a total of 32 GLBs in the
ispLSI 2128E device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or
registered.Inputs to the GLB come from the GRP and
dedicated inputs. All of the GLB outputs are brought back
into the GRP so that they can be connected to the inputs
— Superior Quality of Results
of any GLB on the device.
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
The device also has 128 I/O cells, each of which is
Tools, Timing Simulator and ispANALYZER™
directly connected to an I/O pin. Each I/O cell can be
— PC and UNIX Platforms
Copyright © 1998 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
November 1998
2128e_02
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2128E pdf
Specifications ispLSI 2128E
External Timing Parameters
Over Recommended Operating Conditions
PARAMETER
TEST
COND.4
#2
DESCRIPTION1
-180
-135
-100
UNITS
MIN. MAX. MIN. MAX. MIN. MAX.
tpd1
A 1 Data Prop Delay, 4PT Bypass, ORP Bypass
5.0 7.5 10.0 ns
tpd2
A 2 Data Prop Delay
7.5 10.0 13.0 ns
fmax
A 3 Clk Freq with Internal Feedback3
180 135 100 MHz
fmax (Ext.)
fmax (Tog.)
4
Clk
Freq
with
External
Feedback
(1
tsu2 +
)tco1
5 Clk Frequency, Max. Toggle
125 100 77.0
200 143 100
MHz
MHz
tsu1
6 GLB Reg Setup Time before Clk, 4 PT Bypass 4.0 5.0 6.5 ns
tco1
A 7 GLB Reg Clk to Output Delay, ORP Bypass
3.0 4.0 5.0 ns
th1
8 GLB Reg Hold Time after Clk, 4 PT Bypass
0.0 0.0 0.0
ns
tsu2
9 GLB Reg Setup Time before Clk
5.0 6.0 8.0
ns
tco2
10 GLB Reg Clk to Output Delay
3.5 4.5 6.0 ns
th2 11 GLB Reg Hold Time after Clk
0.0 0.0 0.0
ns
tr1
A 12 External Reset Pin to Output Delay
7.0 10.0 13.5 ns
trw1
13 External Reset Pulse Duration
4.0 5.0 6.5
ns
tptoeen
B 14 Input to Output Enable
10.0 12.0 15.0 ns
tptoedis
C 15 Input to Output Disable
10.0 12.0 15.0 ns
tgoeen
B 16 Global OE Output Enable
5.0 7.0 9.0 ns
tgoedis
C 17 Global OE Output Disable
5.0 7.0 9.0 ns
twh
18 External Synch Clk Pulse Duration, High
2.5 3.5 5.0
ns
twl
19 External Synch Clk Pulse Duration, Low
2.5 3.5 5.0
ns
1. Unless noted otherwise, all parameters use a GRP load of four GLBs, 20 PTXOR path, ORP and Y0 clock.
2. Refer to Timing Model in this data sheet for further details.
3. Standard 16-bit counter using GRP feedback.
4. Reference Switching Test Conditions section.
Table 2-0030A/2128E
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2128E arduino
Specifications ispLSI 2128E
Part Number Description
Device Family
ispLSI 2128EXXX X XXXX X
Device Number
Speed
180 = 180 MHz fmax
135 = 135 MHz fmax
100 = 100 MHz fmax
Grade
Blank = Commercial
Package
T176 = TQFP
Power
L = Low
0212/2128E
ispLSI 2128E Ordering Information
FAMILY
ispLSI
fmax (MHz)
180
135
100
tpd (ns)
5.0
7.5
10.0
ORDERING NUMBER
ispLSI 2128E-180LT176
ispLSI 2128E-135LT176
ispLSI 2128E-100LT176
PACKAGE
176-Pin TQFP
176-Pin TQFP
176-Pin TQFP
Table 2-0041/2128E
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