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PDF LM7810 Datasheet ( Hoja de datos )

Número de pieza LM7810
Descripción (LM78XX) 3-Terminal 1A Positive Voltage Regulator
Fabricantes Thinki Semiconductor 
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LM7810 datasheet

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LM7810 pdf
LM78XX
®
LM7815 Electrical Characteristics
Vin=23V, Iout=500mA, 0oCTj125oC, Cin=0.33uF, Cout=0.1uF; unless otherwise specified.)
Parameter
Symbol
Test Condition
Min Typ
Tj=25oC
14.42 15
Output voltage
Vout
17.5VVin30V,
10mAIout1A, PD 15W
14.28 15
Line Regulation
REGline Tj=25oC 17.5VVin30V
18VVin22V
-- 12
-- 3
Load Regulation
Quiescent Current
REGload
Iq
Tj=25oC
10mAIout1A
250mAIout750mA
Tj=25oC, Iout=0
--
--
--
12
4
4.3
Quiescent Current Change
Output Noise Voltage
Iq
17.5VVin30V
10mAIout1A
Vn 10Hzf100KHz, Tj=25oC
-- --
-- --
-- 90
Ripple Rejection Ratio
Voltage Drop
RR
Vdrop
f=120Hz, 18VVin28V
Iout=1.0A, Tj=25oC
54 70
-- 2
Output Resistance
Output Short Circuit Current
Peak Output Current
Rout
Ios
Io peak
f=1KHz
Tj=25oC
Tj=25oC
-- 19
-- 230
-- 2.2
Temperature Coefficient of
Output Voltage
Vout/ Tj Iout=10mA, 0oCTj125oC
-- -1
Max
15.60
15.75
Unit
V
300
150
mV
300
150
8
1 mA
0.5
-- µV
-- dB
-- V
-- mΩ
-- mA
-- A
-- mV/ oC
LM7818 Electrical Characteristics
(Vin=24V, Iout=500mA, 0oCTj125oC, Cin=0.33uF, Cout=0.1uF; unless otherwise specified.)
Parameter
Symbol
Test Condition
Min Typ Max Unit
Tj=25oC
17.30 18 18.72
Output Voltage
Vout
21VVin33V, 10mAIout1A,
PD 15W
17.14
18
18.90
V
Line Regulation
Load Regulation
Quiescent Current
REGline
REGload
Iq
Tj=25oC
21VVin33V
22VVin26V
Tj=25oC 10mAIout1A
250mAIout750mA
Tj=25oC, Iout=0
--
--
--
--
--
15 360
5 180
mV
12 360
4 180
4.5 8
Quiescent Current Change
Output Noise Voltage
Iq
21VVin33V
10mAIout1A
Vn 10Hzf100KHz, Tj=25oC
-- -- 1 mA
-- -- 0.5
-- 110 --
uV
Ripple Rejection Ratio
Voltage Drop
RR
Vdrop
f=120Hz, 21VVin31V
Iout=1.0A, Tj=25oC
54 70 -- dB
-- 2 -- V
Output Resistance
Output Short Circuit Current
Peak Output Current
Rout
Ios
Io peak
f=1KHz
Tj=25oC
Tj=25oC
-- 22 -- mΩ
-- 200 -- mA
-- 2.2 --
A
Temperature Coefficient of
Output Voltage
Vout/ Tj Iout=10mA, 0oCTj125oC
-- -1 -- mV/ oC
Pulse testing techniques are used to maintain the junction temperature as close to the ambient temperature as
possible, and thermal effects must be taken into account separately.
This specification applies only for DC power dissipation permitted by absolute maximum ratings.
© 2006 Thinki Semiconductor Co.,Ltd.
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http://www.thinkisemi.com/
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