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PDF VNQ810-E Data sheet ( Hoja de datos )

Número de pieza VNQ810-E
Descripción QUAD CHANNEL HIGH SIDE DRIVER
Fabricantes STMicroelectronics 
Logotipo STMicroelectronics Logotipo



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VNQ810-E
QUAD CHANNEL HIGH SIDE DRIVER
Table 1. General Features
Type
RDS(on)
Iout
VNQ810-E
160m(*) 3.5A (*)
(*) Per each channel
VCC
36V
s CMOS COMPATIBLE INPUTS
s OPEN DRAIN STATUS OUTPUTS
s ON STATE OPEN LOAD DETECTION
s OFF STATE OPEN LOAD DETECTION
s SHORTED LOAD PROTECTION
s UNDERVOLTAGE AND OVERVOLTAGE
SHUTDOWN
s PROTECTION AGAINST LOSS OF GROUND
s VERY LOW STAND-BY CURRENT
s REVERSE BATTERY PROTECTION (**)
s IN COMPLIANCE WITH THE 2002/95/EC
EUROPEAN DIRECTIVE
Figure 1. Package
SO-28 (DOUBLE ISLAND)
DESCRIPTION
The VNQ810-E is a quad HSD formed by
assembling two VND810-E chips in the same SO-
28 package. The VNQ810-E is a monolithic device
made by using STMicroelectronics VIPower M0-3
Technology, intended for driving any kind of load
with one side connected to ground. Active VCC pin
voltage clamp protects the device against low
energy spikes (see ISO7637 transient
compatibility table).
Active current limitation combined with thermal
shutdown and automatic restart protects the
device against overload. The device detects open
load condition both in on and off state. Output
shorted to VCC is detected in the off state. Device
automatically turns off in case of ground pin
disconnection.
Table 2. Order Codes
Package
SO-28
VNQ810-E
Tube
Note: (**) See application schematic at page 9
Tape and Reel
VNQ810TR-E
October 2004
Rev. 1
1/20

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VNQ810-E pdf
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VNQ810-E
ELECTRICAL CHARACTERISTICS (continued)
Table 8. Status Pin (Per each channel)
Symbol
VSTAT
ILSTAT
CSTAT
VSCL
Parameter
Status Low Output Voltage
Status Leakage Current
Status Pin Input
Capacitance
Status Clamp Voltage
Test Conditions
ISTAT=1.6mA
Normal Operation; VSTAT=5V
Normal Operation; VSTAT=5V
ISTAT=1mA
ISTAT=-1mA
Min Typ Max Unit
0.5 V
10 µA
100 pF
6 6.8 8
-0.7
V
V
Table 9. Switching (Per each channel) (VCC=13V)
Symbol
td(on)
Parameter
Turn-on Delay Time
td(off)
Turn-off Delay Time
Test Conditions
RL=13from VIN rising edge to
VOUT=1.3V
RL=13from VIN falling edge to
VOUT=11.7V
Min
dVOUT/dt(on) Turn-on Voltage Slope RL=13from VOUT=1.3V to VOUT=10.4V
dVOUT/dt(off) Turn-off Voltage Slope RL=13from VOUT=11.7V to VOUT=1.3V
Typ
30
30
See
relative
diagram
See
relative
diagram
Max
Unit
µs
µs
V/µs
V/µs
Table 10. Openload Detection
Symbol
IOL
tDOL(on)
VOL
tDOL(off)
Parameter
Openload ON State
Detection Threshold
Openload ON State
Detection Delay
Openload OFF State
Voltage Detection
Threshold
Openload Detection Delay
at Turn Off
VIN=5V
IOUT=0A
VIN=0V
Test Conditions
Min Typ Max Unit
20 40 80 mA
200 µs
1.5 2.5 3.5
V
1000 µs
Table 11. Logic Input (Per each channel)
Symbol
VIL
IIL
VIH
IIH
VI(hyst)
VICL
Parameter
Test Conditions
Input Low Level
Low Level Input Current VIN=1.25V
Input High Level
High Level Input Current VIN=3.25V
Input Hysteresis Voltage
Input Clamp Voltage
IIN=1mA
IIN=-1mA
Min
1
3.25
0.5
6
Typ
6.8
-0.7
Max
1.25
10
8
Unit
V
µA
V
µA
V
V
V
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VNQ810-E arduino
Figure 10. Off State Output Current
IL(off1) (uA)
1.6
1.44
Off state
1.28 Vcc=36V
Vin=Vout=0V
1.12
0.96
0.8
0.64
0.48
0.32
0.16
0
-50 -25 0 25 50 75 100 125 150 175
Tc (ºC)
Figure 11. Input Clamp Voltage
Vicl (V)
8
7.8
Iin=1mA
7.6
7.4
7.2
7
6.8
6.6
6.4
6.2
6
-50 -25 0 25
50 75
Tc (°C)
100 125 150 175
Figure 12. Status Low Output Voltage
Vstat (V)
0.8
0.7
Istat=1.6mA
0.6
0.5
0.4
0.3
0.2
0.1
0
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
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VNQ810-E
Figure 13. High Level Input Current
Iih (uA)
5
4.5
Vin=3.25V
4
3.5
3
2.5
2
1.5
1
0.5
0
-50 -25 0 25
50 75
Tc (°C)
100 125 150 175
Figure 14. Status Leakage Current
Ilstat (uA)
0.05
0.04
Vstat=5V
0.03
0.02
0.01
0
-50 -25 0 25 50 75 100 125 150 175
Tc (°C)
Figure 15. Status Clamp Voltage
Vscl (V)
8
7.8
Istat=1mA
7.6
7.4
7.2
7
6.8
6.6
6.4
6.2
6
-50 -25 0 25
50 75
Tc (°C)
100 125 150 175
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