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PDF WCMA2008U1B Data sheet ( Hoja de datos )

Número de pieza WCMA2008U1B
Descripción 256K x 8 Static RAM
Fabricantes Weida Semiconductor 
Logotipo Weida Semiconductor Logotipo



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WCMA2008U1B
WCMA2008U1B
Features
• High Speed
— 70ns availability
• Voltage range
— 2.7V–3.3V
• Ultra low active power
— Typical active current: 1 mA @ f = 1MHz
— Typical active current: 7 mA @ f = fmax (70ns speed)
• Low standby power
• Easy memory expansion withCE1,CE2,and OEfeatures
• Automatic power-down when deselected
• CMOS for optimum speed/power
Functional Description
The WCMA2008U1B is a high-performance CMOS static
RAM organized as 256K words by 8 bits. This device features
advanced circuit design to provide ultra-low active current.
This is device is ideal for portable applications. The device
also has an automatic power-down feature that significantly
Logic Block Diagram
256K x 8 Static RAM
reduces power consumption by 80% when addresses are not
toggling. The device can be put into standby mode reducing
power consumption by more than 99% when deselected (CE1
HIGH or CE2 LOW).
Writing to the device is accomplished by taking Chip Enable
(CE1) and Write Enable (WE) inputs LOW and Chip Enable 2
(CE 2) HIGH. Data on the eight I/O pins (I/O0 through I/O7) is
then written into the location specified on the address pins (A0
through A17).
Reading from the device is accomplished by taking Chip En-
able (CE1) and Output Enable (OE) LOW while forcing Write
Enable (WE) and Chip Enable 2 (CE2) HIGH. Under these
conditions, the contents of the memory location specified by
the address pins will appear on the I/O pins.
The eight input/output pins (I/O0 through I/O7) are placed in a
high-impedance state when the device is deselected (CE1
HIGH or CE2 LOW), the outputs are disabled (OE HIGH), or
during a write operation (CE1 LOW and CE2 HIGH and WE
LOW).
The WCMA2008U1B is available in a 36-ball FBGA package.
www.DataSheet4U.com
AAA120
AA34
AAA567
AAAA111890
CE 2 CE1
WE
OE
Data in Drivers
128K x 8
ARRAY
COLUMN
DECODER
POWER
DOWN
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7

1 page




WCMA2008U1B pdf
WCMA2008U1B
Switching Characteristics Over the Operating Range[5]
WCMA2008U1B-70
Parameter
Description
Min.
Max.
Unit
READ CYCLE
tRC
tAA
tOHA
tACE
tDOE
tLZOE
tHZOE
tLZCE
tHZCE
tPU
tPD
WRITE CYCLE[8,]
Read Cycle Time
Address to Data Valid
Data Hold from Address Change
CE1 LOW and CE2 HIGH to Data Valid
OE LOW to Data Valid
OE LOW to Low Z[6]
OE HIGH to High Z[6, 7]
CE 1 LOW and CE2 HIGH to Low Z[6]
CE 1 HIGH or CE2 LOW to High Z[6, 7]
CE1 LOW and CE2 HIGH to Power-Up
CE1 HIGH or CE2 LOW to Power-Down
70
10
5
10
0
70
70
35
25
25
70
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tWC Write Cycle Time
70 ns
tSCE
CE1 LOW and CE2 HIGH to Write End
60
ns
tAW
Address Set-Up to Write End
60
ns
tHA
Address Hold from Write End
0
ns
tSA
Address Set-Up to Write Start
0
ns
tPWE
WE Pulse Width
50 ns
tSD
Data Set-Up to Write End
30
ns
tHD
Data Hold from Write End
0
ns
tHZWE
WE LOW to High Z[6, 7]
25 ns
tLZWE
WE HIGH to Low Z[6]
10 ns
www.DaNtaoStehse: et4U.com
5. Test conditions assume signal transition time of 5 ns or less, timing reference levels of VCC(typ.)/2, input pulse levels of 0 to VCC(typ.), and output loading
of the specified IOL /IOH and 30 pF load capacitance.
6. At any given temperature and voltage condition, tHZCE is less than t LZCE, t HZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. tHZOE, t HZCE, and t HZWE transitions are measured when the outputs enter a high impedance state.
8. The internal write time of the memory is defined by the overlap of WE, CE1 = VIL , and CE2 = VIH . All signals must be ACTIVE to initiate a write and any
of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that
terminates the write.
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WCMA2008U1B arduino
Document Title: WCMA2008U1B, 256K x 8 Static RAM
REV. Spec #
ECN #
Issue Date
** 38-05321
117495
3/18/2002
WCMA2008U1B
Orig. of Change Description of Change
CBD
New Data Sheet
www.DataSheet4U.com
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