PDF ICX059CL Data sheet ( Hoja de datos )

Número de pieza	ICX059CL
Descripción	Diagonal 6mm (Type 1/3) CCD Image Sensor
Fabricantes	Sony Corporation
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No Preview Available ! ICX059CL wwDw.iDaagtaoShneaetl4U6.mcomm (Type 1/3) CCD Image Sensor for CCIR Black-and-White Video Camera Description The ICX059CL is an interline CCD solid-state image sensor suitable for CCIR black-and-white video cameras. Compared with the current product ICX059AL, sensitivity is improved drastcally through the adoption of Super HAD CCD technology. This chip features a field period readout system and an electronic shutter with variable charge-storage time. 16 pin DIP (Plastic) Features • High sensitivity (+4dB at F8, +3dB at F1.2 compared with ICX059AL) • High resolution, low smear and low dark current • Excellent antiblooming characteristics • Continuous variable-speed shutter • Horizontal register: 5V drive • Reset gate: 5V drive V Pin 1 Device Structure • Interline CCD image sensor • Image size: • Number of effective pixels: • Number of total pixels: • Chip size: • Unit cell size: • Optical black: • Number of dummy bits: • Substrate material: 3 Pin 9 H 40 Diagonal 6mm (Type 1/3) 752 (H) × 582 (V) approx. 440K pixels 795 (H) × 596 (V) approx. 470K pixels Optical black position (Top View) 6.00mm (H) × 4.96mm (V) 6.50µm (H) × 6.25µm (V) Horizontal (H) direction: Front 3 pixels, rear 40 pixels Vertical (V) direction: Front 12 pixels, rear 2 pixels Horizontal 22 Vertical 1 (even field only) Silicon 2 12 ∗Super HAD CCD is a registered trademark of Sony Corporation. Super HAD CCD is a CCD that drastically improves sensitivity by introducing newly developed semiconductor technology by Sony Corporation into Sony's high-performance HAD (Hole-Accumulation Diode) sensor. Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E97X22A99 1 page ICX059CL Cwlwowc.kDaEtaqSuhieveat4leUn.ctomCircuit Constant Item Capacitance between vertical transfer clock and GND Capacitance between vertical transfer clocks Capacitance between horizontal transfer clock and GND Capacitance between horizontal transfer clocks Capacitance between horizontal final stage transfer clock and GND Capacitance between reset gate clock and GND Capacitance between substrate clock and GND Vertical transfer clock series resistor Vertical transfer clock ground resistor Horizontal transfer clock series resistor Symbol CφV1, CφV3 CφV2, CφV4 CφV12, CφV34 CφV23, CφV41 CφV13 CφV24 CφH1, CφH2 CφHH CφLH CφRG CφSUB R1, R2, R3, R4 RGND RφH Min. Typ. Max. Unit Remarks 1000 pF 560 pF 470 pF 390 pF 180 pF 100 pF 47 pF 51 pF 8 pF 8 pF 270 pF 80 Ω 15 Ω 15 Ω Vφ1 R1 CφV12 Vφ2 R2 CφV41 CφV1 CφV2 CφV23 CφV24 R4 CφV4 RGND CφV3 CφV34 CφV13 R3 Vφ4 Vφ3 Vertical transfer clock equivalent circuit RφH Hφ1 CφH1 CφHH RφH Hφ2 CφH2 Horizontal transfer clock equivalent circuit –5– 5 Page ICX059CL 6w. wDwa.DrkatasSighneeatl4sUh.caodming After measuring 5, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark signal output and substitute the values into the following formula. ∆Vdt = Vdmax – Vdmin [mV] 7. Flicker Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the signal output is 200mV, and then measure the difference in the signal level between fields (∆Vf [mV]). Then substitute the value into the following formula. F = (∆Vf/200) × 100 [%] 8. Lag Adjust the signal output value generated by strobe light to 200mV. After setting the strobe light so that it strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following formula. Lag = (Vlag/200) × 100 [%] FLD SG1 Strobe light timing Output Light Signal output 200mV Vlag (lag) – 11 – 11 Page

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