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PDF OP27GP Data sheet ( Hoja de datos )
| Número de pieza | OP27GP | |
| Descripción | Low-Noise / Precision Operational Amplifier | |
| Fabricantes | Analog Devices | |
| Logotipo |  |
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FEATURES
Low Noise: 80 nV p-p (0.1 Hz to 10 Hz), 3 nV/√Hz
Low Drift: 0.2 V/؇C
High Speed: 2.8 V/s Slew Rate, 8 MHz Gain
Bandwidth
Low VOS: 10 V
Excellent CMRR: 126 dB at VCM of ±11 V
High Open-Loop Gain: 1.8 Million
Fits 725, OP07, 5534A Sockets
Available in Die Form
GENERAL DESCRIPTION
The OP27 precision operational amplifier combines the low
offset and drift of the OP07 with both high speed and low noise.
Offsets down to 25 µV and drift of 0.6 µV/°C maximum make
the OP27 ideal for precision instrumentation applications.
Exceptionally low noise, en = 3.5 nV/√Hz, at 10 Hz, a low 1/f
noise corner frequency of 2.7 Hz, and high gain (1.8 million),
allow accurate high-gain amplification of low-level signals. A
gain-bandwidth product of 8 MHz and a 2.8 V/µsec slew rate
provides excellent dynamic accuracy in high-speed, data-
acquisition systems.
A low input bias current of ± 10 nA is achieved by use of a
bias-current-cancellation circuit. Over the military temperature
range, this circuit typically holds IB and IOS to ±20 nA and 15 nA,
respectively.
The output stage has good load driving capability. A guaranteed
swing of ± 10 V into 600 Ω and low output distortion make the
OP27 an excellent choice for professional audio applications.
(Continued on page 7)
Low-Noise, Precision
Operational Amplifier
OP27
PIN CONNECTIONS
TO-99
(J-Suffix)
BAL
BAL 1
–IN 2
OP27
V+
OUT
+IN 3
NC
4V– (CASE)
NC = NO CONNECT
8-Pin Hermetic DIP
(Z-Suffix)
Epoxy Mini-DIP
(P-Suffix)
8-Pin SO
(S-Suffix)
VOS TRIM 1
–IN 2
+IN 3
V– 4
OP27
8 VOS TRIM
7 V+
6 OUT
5 NC
NC = NO CONNECT
R3
Q6
R1*
18
VOS ADJ.
R4
R2*
NONINVERTING
INPUT (+)
INVERTING
INPUT (–)
Q1A Q1B
Q3
*R1 AND R2 ARE PERMANENTLY
ADJUSTED AT WAFER TEST FOR
MINIMUM OFFSET VOLTAGE.
Q2B Q2A
C2
R23 R24
Q22 C1
Q21
Q23 Q24
R9
Q20 Q19
R12
R5 C3 C4
Q11 Q12
Q27
Q28
Q26
V+
Q46
OUTPUT
Q45
V–
REV. A
Figure 1. Simplified Schematic
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 2002
1 page  
DICE CHARACTERISTICS
OP27
1. NULL
2. (–) INPUT
3. (+) INPUT
4. V–
6. OUTPUT
7. V+
8. NULL
DIE SIZE 0.109 ؋ 0.055 INCH, 5995 SQ. MILS
(2.77 ؋ 1.40mm, 3.88 SQ. mm)
WAFER TEST LIMITS (@ VS = ±15 V, TA = 25؇C unless otherwise noted.)
Parameter
Symbol Conditions
OP27N
Limit
OP27G
Limit
OP27GR
Limit
Unit
INPUT OFFSET VOLTAGE*
VOS
35 60 100 µV Max
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
IOS
IB
35 50 75 nA Max
± 40 ± 55 ± 80 nA Max
INPUT VOLTAGE RANGE
IVR
± 11 ± 11 ± 11 V Min
COMMON-MODE REJECTION
RATIO
CMRR
POWER SUPPLY
PSRR
VCM = IVR
VS = ± 4 V to ± 18 V
114
10
106 100 dB Min
10 20 µV/V Max
LARGE-SIGNAL VOLTAGE
GAIN
OUTPUT VOLTAGE SWING
POWER CONSUMPTION
AVO
AVO
VO
VO
Pd
RL ≥ 2 kΩ, VO = ± 10 V
RL ≥ 600 Ω, VO = ± 10 V
RL ≥ 2 kΩ
RL2600n
VO = 0
1000
800
± 12.0
± 10.0
140
1000
800
± 12.0
± 10.0
140
700
600
+11.5
± 10.0
170
V/mV Min
V/mV Min
V Min
V Min
mW Max
NOTE
*Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. A
–5–
5 Page 
0.1F
100k⍀
OP27
10⍀ D.U.T.
2k⍀
VOLTAGE
GAIN
= 50,000
4.7F
OP12
100k⍀
4.3k⍀ 22F
SCOPE ؋ 1
RIN = 1M⍀
0.1F 2.2F
24.3k⍀
110k⍀
2.4
TA = 25؇C
2.2 VS = ؎15V
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
100
1k 10k
LOAD RESISTANCE – ⍀
100k
TPC 28. Voltage Noise Test Circuit
(0.1 Hz to 10 Hz)
TPC 29. Open-Loop Voltage Gain vs.
Load Resistance
160
TA = 25؇C
140
120
100
80
NEGATIVE
SWING
60
POSITIVE
40 SWING
20
0
1 10 100 1k 10k 100k 1M 10M 100M
FREQUENCY – Hz
TPC 31. PSRR vs. Frequency
OP27
120
80
40
0
–40
–90
–120
1 SEC/DIV
0.1Hz to 10Hz p-p NOISE
TPC 30. Low-Frequency Noise
APPLICATION INFORMATION
OP27 series units may be inserted directly into 725 and OP07
sockets with or without removal of external compensation or
nulling components. Additionally, the OP27 may be fitted to
unnulled 741-type sockets; however, if conventional 741 nulling
circuitry is in use, it should be modified or removed to ensure
correct OP27 operation. OP27 offset voltage may be nulled to
zero (or another desired setting) using a potentiometer (see
Offset Nulling Circuit).
The OP27 provides stable operation with load capacitances of
up to 2000 pF and ± 10 V swings; larger capacitances should be
decoupled with a 50 Ω resistor inside the feedback loop. The
OP27 is unity-gain stable.
Thermoelectric voltages generated by dissimilar metals at the
input terminal contacts can degrade the drift performance. Best
operation will be obtained when both input contacts are main-
tained at the same temperature.
OFFSET VOLTAGE ADJUSTMENT
The input offset voltage of the OP27 is trimmed at wafer level.
However, if further adjustment of VOS is necessary, a 10 kΩ trim
potentiometer can be used. TCVOS is not degraded (see Offset
Nulling Circuit). Other potentiometer values from 1 kΩ to 1 MΩ
can be used with a slight degradation (0.1 µV/°C to 0.2 µV/°C)
of TCVOS. Trimming to a value other than zero creates a drift of
approximately (VOS/300) µV/°C. For example, the change in
TCVOS will be 0.33 µV/°C if VOS is adjusted to 100 µV. The
offset voltage adjustment range with a 10 kΩ potentiometer is
± 4 mV. If smaller adjustment range is required, the nulling
sensitivity can be reduced by using a smaller pot in conjuction
with fixed resistors. For example, the network below will have a
± 280 µV adjustment range.
1 4.7k⍀ 1k⍀ POT 4.7k⍀
8
V+
Figure 2.
NOISE MEASUREMENTS
To measure the 80 nV peak-to-peak noise specification of the
OP27 in the 0.1 Hz to 10 Hz range, the following precautions
must be observed:
1. The device must be warmed up for at least five minutes.
As shown in the warm-up drift curve, the offset voltage
typically changes 4 µV due to increasing chip temperature
after power-up. In the 10-second measurement interval,
these temperature-induced effects can exceed tens-of-
nanovolts.
2. For similar reasons, the device has to be well-shielded from
air currents. Shielding minimizes thermocouple effects.
REV. A
–11–
11 Page | ||
| Páginas | Total 16 Páginas | |
| PDF Descargar | [ Datasheet OP27GP.PDF ] | |
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