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PDF BAT54H Data sheet ( Hoja de datos )

Número de pieza BAT54H
Descripción Schottky barrier single diode
Fabricantes NXP Semiconductors 
Logotipo NXP Semiconductors Logotipo



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BAT54H
Schottky barrier single diode in small SOD123F package
Rev. 01 — 7 April 2005
Product data sheet
1. Product profile
1.1 General description
Planar Schottky barrier single diode with an integrated guard ring for stress protection,
encapsulated in a SOD123F small and flat lead SMD plastic package.
1.2 Features
s Low forward voltage
s Small and flat lead SMD plastic package
s Low capacitance
s Flat leads: excellent coplanarity and improved thermal behavior
1.3 Applications
s Ultra high-speed switching
s Voltage clamping
s Line termination
s Inverse-polarity protection
1.4 Quick reference data
Table 1:
Symbol
IF
VR
VF
Quick reference data
Parameter
forward current
reverse voltage
forward voltage
[1] Pulse test: tp 300 µs; δ ≤ 0.02.
2. Pinning information
Conditions
IF = 10 mA
Min Typ Max Unit
- - 200 mA
- - 30 V
[1] - - 400 mV
Table 2:
Pin
1
2
Pinning
Description
cathode
anode
[1] The marking bar indicates the cathode.
Simplified outline
[1]
12
Symbol
12
sym001

1 page




BAT54H pdf
Philips Semiconductors
8. Package outline
BAT54H
Schottky barrier single diode in SOD123F package
3.6 2.7
3.4 2.5
1.7
1.5
1
1.2
1.0
0.55
0.35
Dimensions in mm
Fig 4. Package outline SOD123F
2
0.70
0.55
0.25
0.10
04-11-29
9. Packing information
Table 8: Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code. [1]
Type number Package Description
Packing quantity
3 000
10 000
BAT54H
SOD123F 4 mm pitch, 8 mm tape and reel
-115
-135
[1] For further information and the availability of packing methods, see Section 15.
10. Soldering
4.4
4
2.9
1.6
2.1 1.6
1.1 1.2
1.1
(2×)
Reflow soldering is the only recommended soldering method.
Dimensions in mm
Fig 5. Reflow soldering footprint SOD123F
solder lands
solder resist
solder paste
occupied area
9397 750 14919
Product data sheet
Rev. 01 — 7 April 2005
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
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