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PDF SCAN18540T Data sheet ( Hoja de datos )

Número de pieza SCAN18540T
Descripción Inverting Line Driver
Fabricantes Fairchild Semiconductor 
Logotipo Fairchild Semiconductor Logotipo



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No Preview Available ! SCAN18540T Hoja de datos, Descripción, Manual

October 1991
Revised May 2000
SCAN18540T
Inverting Line Driver with 3-STATE Outputs
General Description
The SCAN18540T is a high speed, low-power line driver
featuring separate data inputs organized into dual 9-bit
bytes with byte-oriented paired output enable control sig-
nals. This device is compliant with IEEE 1149.1 Standard
Test Access Port and Boundary Scan Architecture with the
incorporation of the defined boundary-scan test logic and
test access port consisting of Test Data Input (TDI), Test
Data Out (TDO), Test Mode Select (TMS), and Test Clock
(TCK).
Features
s IEEE 1149.1 (JTAG) compliant
s Dual output enable signals per byte
s 3-STATE outputs for bus-oriented applications
s 9-bit data busses for parity applications
s Reduced-swing outputs source 32 mA/sink 64 mA
s Guaranteed to drive 50transmission line to TTL input
levels of 0.8V and 2.0V
s TTL compatible inputs
s 25 mil pitch SSOP (Shrink Small Outline Package)
s Includes CLAMP and HIGHZ instructions
s Member of Fairchild’s SCAN products
Ordering Code:
Order Number Package Number
Package Description
SCAN18540TSSC
MS54A
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Connection Diagram
Pin Descriptions
Pin Names
AI(08)
BI(08)
AOE1, AOE2
BOE1, BOE2
AO(08)
BO(08)
Description
Input pins, A side
Input pins, B side
3-STATE Output Enable Input pins, A side
3-STATE Output Enable Input pins, B side
Output pins, A side
Output pins, B side
Truth Tables
AOE1
L
H
X
L
Inputs
AOE2
L
X
H
L
AI(0–8)
H
X
X
L
AO(0–8)
L
Z
Z
H
Inputs
BOE1
BOE2
BI(0–8)
LL
H
HX
X
XH
X
LL
L
H = HIGH Voltage Level X = Immaterial
L = LOW Voltage Level Z = High Impedance
BO(0–8)
L
Z
Z
H
© 2000 Fairchild Semiconductor Corporation DS010964
www.fairchildsemi.com

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SCAN18540T pdf
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BOUNDARY-SCAN Register Definition Index
Pin Name
Pin No.
Pin Type
Scan Cell Type
AOE1
AOE2
AOE
BOE1
BOE2
BOE
AI0
AI1
AI2
AI3
AI4
AI5
AI6
AI7
AI8
BI0
BI1
BI2
BI3
BI4
BI5
BI6
BI7
BI8
AO0
AO1
AO2
AO3
AO4
AO5
AO6
AO7
AO8
BO0
BO1
BO2
BO3
BO4
BO5
BO6
BO7
BO8
3
Input
TYPE1
54
Input
TYPE1
Internal
TYPE2
Control
26
Input
TYPE1
Signals
31
Input
TYPE1
Internal
TYPE2
55
Input
TYPE1
53
Input
TYPE1
52
Input
TYPE1
50
Input
TYPE1
49
Input
TYPE1
Ain
47
Input
TYPE1
46
Input
TYPE1
44
Input
TYPE1
43
Input
TYPE1
42
Input
TYPE1
41
Input
TYPE1
39
Input
TYPE1
38
Input
TYPE1
36
Input
TYPE1
Bin
35
Input
TYPE1
33
Input
TYPE1
32
Input
TYPE1
30
Input
TYPE1
2
Output
TYPE2
4
Output
TYPE2
5
Output
TYPE2
7
Output
TYPE2
8
Output
TYPE2
Aout
10
Output
TYPE2
11
Output
TYPE2
13
Output
TYPE2
14
Output
TYPE2
15
Output
TYPE2
16
Output
TYPE2
18
Output
TYPE2
19
Output
TYPE2
21
Output
TYPE2
Bin
22
Output
TYPE2
24
Output
TYPE2
25
Output
TYPE2
27
Output
TYPE2
5 www.fairchildsemi.com

5 Page





SCAN18540T arduino
Physical Dimensions inches (millimeters) unless otherwise noted
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Package Number MS56A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
www.fairchildsemi.com
11 www.fairchildsemi.com

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