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PDF TC55NEM208AFPV Data sheet ( Hoja de datos )
| Número de pieza | TC55NEM208AFPV | |
| Descripción | STATIC RAM | |
| Fabricantes | Toshiba Semiconductor | |
| Logotipo |  |
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TC55NEM208AFPV/AFTV55,70
TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
524,288-WORD BY 8-BIT STATIC RAM
DESCRIPTION
The TC55NEM208AFPV/AFTV is a 4,194,304-bit static random access memory (SRAM) organized as 524,288
words by 8 bits. Fabricated using Toshiba's CMOS Silicon gate process technology, this device operates from a
single 2.7 to 5.5 V power supply. Advanced circuit technology provides both high speed and low power at an
operating current of 3 mA/MHz (typ) and a minimum cycle time of 55 ns. It is automatically placed in low-power
mode at 1 µA standby current (typ) when chip enable ( CE ) is asserted high. There are two control inputs. CE is
used to select the device and for data retention control, and output enable ( OE ) provides fast memory access. This
device is well suited to various microprocessor system applications where high speed, low power and battery
backup are required. And, with a guaranteed operating range of −40° to 85°C, the TC55NEM208AFPV/AFTV can
be used in environments exhibiting extreme temperature conditions. The TC55NEM208AFPV/AFTV is available in
a standard plastic 32-pin small-outline package (SOP) and normal and reverse pinout plastic 32-pin
thin-small-outline package (TSOP).
FEATURES
• Low-power dissipation
Operating: 15 mW/MHz (typical)
• Single power supply voltage of 2.7 to 5.5 V
• Power down features using CE .
• Data retention supply voltage of 2.0 to 5.5 V
• Direct TTL compatibility for all inputs and outputs
• Wide operating temperature range of −40° to 85°C
• Standby Current (maximum):20 µA
• Access Times (maximum):
TC55NEM208AFPV/AFTV
55 70
Access Time
55 ns
70 ns
CE Access Time
55 ns
70 ns
OE Access Time
30 ns
35 ns
• Package:
SOP32-P-525-1.27 (AFPV)
(Weight:
TSOP II32-P-400-1.27 (AFTV) (Weight:
g typ)
g typ)
PIN ASSIGNMENT (TOP VIEW)
32 PIN SOP & TSOP
A18
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32 VDD
31 A15
30 A17
29 R/W
28 A13
27 A8
26 A9
25 A11
24 OE
23 A10
22 CE
21 I/O8
20 I/O7
19 I/O6
18 I/O5
17 I/O4
(AFPV/AFTV)
PIN NAMES
A0~A18
R/W
OE
CE
I/O1~I/O8
VDD
GND
Address Inputs
Read/Write Control
Output Enable
Chip Enable
Data Inputs/Outputs
Power
Ground
2002-10-31 1/11
1 page  
TC55NEM208AFPV/AFTV55,70
AC CHARACTERISTICS AND OPERATING CONDITIONS (Ta = −40° to 85°C, VDD=2.7 to 5.5 V)
READ CYCLE
SYMBOL
PARAMETER
tRC
tACC
tCO
tOE
tCOE
tOEE
tOD
tODO
tOH
Read Cycle Time
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Chip Enable Low to Output Active
Output Enable Low to Output Active
Chip Enable High to Output High-Z
Output Enable High to Output High-Z
Output Data Hold Time
TC55NEM208AFPV/AFTV
55 70
MIN MAX MIN MAX
70 85
70 85
70 85
35 45
55
00
30 35
30 35
10 10
UNIT
ns
WRITE CYCLE
SYMBOL
PARAMETER
tWC
tWP
tCW
tAS
tWR
tODW
tOEW
tDS
tDH
Write Cycle Time
Write Pulse Width
Chip Enable to End of Write
Address Setup Time
Write Recovery Time
R/W Low to Output High-Z
R/W High to Output Active
Data Setup Time
Data Hold Time
TC55NEM208AFPV/AFTV
55 70
MIN MAX MIN MAX
70 85
50 55
55 60
00
00
30 35
00
30 35
00
UNIT
ns
AC TEST CONDITIONS
PARAMETER
Output load
Input pulse level
Timing measurements
Reference level
tR, tF
TEST CONDITION
100 pF (Include Jig)
0.2 V, VDD − 0.2 V
1.5 V
1.5 V
5 ns
2002-10-31 5/11
5 Page 
TC55NEM208AFPV/AFTV55,70
RESTRICTIONS ON PRODUCT USE
000707EBA
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• The products described in this document are subject to the foreign exchange and foreign trade laws.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
• The information contained herein is subject to change without notice.
2002-10-31 11/11
11 Page | ||
| Páginas | Total 11 Páginas | |
| PDF Descargar | [ Datasheet TC55NEM208AFPV.PDF ] | |
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