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PDF IRH7054 Data sheet ( Hoja de datos )

Número de pieza IRH7054
Descripción RADIATION HARDENED POWER MOSFET THRU-HOLE
Fabricantes International Rectifier 
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PD - 90883B
RADIATION HARDENED
IRH7054
POWER MOSFET
60V, N-CHANNEL
THRU-HOLE (T0-204AA/AE) RAD Hard™ HEXFET® TECHNOLOGY
Product Summary
Part Number Radiation Level RDS(on)
IRH7054
100K Rads (Si) 0.025
IRH3054
300K Rads (Si) 0.025
ID
45*A
45*A
IRH4054
600K Rads (Si) 0.02545*A
IRH8054
1000K Rads (Si) 0.02545*A
International Rectifier’s RADHard HEXFET® technol-
ogy provides high performance power MOSFETs for
space applications. This technology has over a de-
cade of proven performance and reliability in satellite
applications. These devices have been character-
ized for both Total Dose and Single Event Effects (SEE).
The combination of low Rdson and low gate charge
reduces the power losses in switching applications
such as DC to DC converters and motor control. These
devices retain all of the well established advantages
of MOSFETs such as voltage control, fast switching,
ease of paralleling and temperature stability of elec-
trical parameters.
TO-204AE
Features:
! Single Event Effect (SEE) Hardened
! Low RDS(on)
! Low Total Gate Charge
! Proton Tolerant
! Simple Drive Requirements
! Ease of Paralleling
! Hermetically Sealed
! Ceramic Package
! Light Weight
Absolute Maximum Ratings
Pre-Irradiation
Parameter
ID @ VGS = 12V, TC = 25°C Continuous Drain Current
ID @ VGS = 12V, TC = 100°C Continuous Drain Current
IDM Pulsed Drain Current
PD @ TC = 25°C
Max. Power Dissipation
Linear Derating Factor
Units
45*
32 A
210
150 W
1.2 W/°C
VGS
EAS
IAR
EAR
dv/dt
TJ
TSTG
Gate-to-Source Voltage
±20
Single Pulse Avalanche Energy
500
Avalanche Current
35
Repetitive Avalanche Energy
15
Peak Diode Recovery dv/dt
3.5
Operating Junction
-55 to 150
Storage Temperature Range
Lead Temperature
300 ( 0.063 in.(1.6mm) from case for 10s)
Weight
11.5 (Typical )
V
mJ
A
mJ
V/ns
oC
g
For footnotes refer to the last page
*Current is limited by pin diameter
www.irf.com
1
8/9/01

1 page




IRH7054 pdf
Pre-Irradiation
IRH7054
8000
6000
VGS = 0V, f = 1MHz
Ciss = Cgs + Cgd , Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
4000
Ciss
Coss
2000
0
1
Crss
10 100
VDS , Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
20 ID = 35A
16
VDS = 48V
VDS = 30V
12
8
4
FOR TEST CIRCUIT
0 SEE FIGURE 13
0 40 80 120 160 200
QG , Total Gate Charge (nC)
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
100
10
TJ = 25 °C
TJ = 150 °C
1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
100 100us
1ms
10 10ms
1 VGS = 0 V
0.4 1.0 1.6 2.2 2.8 3.4 4.0
VSD ,Source-to-Drain Voltage (V)
TC
TJ
=
=
25 °C
150 °C
Single Pulse
1
1
10
100
VDS , Drain-to-Source Voltage (V)
1000
Fig 7. Typical Source-Drain Diode
Forward Voltage
www.irf.com
Fig 8. Maximum Safe Operating Area
5

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