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PDF 5962-90737 Data sheet ( Hoja de datos )

Número de pieza 5962-90737
Descripción ANALOG SWITCH
Fabricantes Siliconix　
Logotipo Siliconix Logotipo



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REVISIONS
LTR DESCRIPTION
A Changes in accordance with N.O.R. 5962-R062-94.
B Redrawn. Add case outline X. Technical and editorial changes throughout.
C Drawing updated to reflect current requirements. - ro
DATE (YR-MO-DA)
93-12-06
95-03-24
01-10-02
APPROVED
M. A. FRYE
M. A. FRYE
R. MONNIN
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
REV
SHEET
PREPARED BY
DAN WONNELL
C
1
C
2
CHECKED BY
SANDRA ROONEY
APPROVED BY
MICHAEL A. FRYE
DRAWING APPROVAL DATE
93-05-06
CCCCCCCCCCC
3 4 5 6 7 8 9 10 11 12 13
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
MICROCIRCUIT, LINEAR, ANALOG SWITCH,
MONOLITHIC SILICON
AMSC N/A
REVISION LEVEL
C
SIZE
A
CAGE CODE
67268
SHEET
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF
13
5962-90737
5962-E640-01

1 page




5962-90737 pdf
Test
Drain-source ON
resistance
Source OFF leakage
current
Drain OFF leakage
current
TABLE I. Electrical performance characteristics.
Symbol
rDS(ON)
Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
IS = -10 mA, VD = ±12.5 V,
VIN = 0.8 V,
V+ = +13.5 V, V- = -13.5 V
Group A Device
subgroups type
1 01
2,3
Limits
Min Max
2.5 35
2.5 45
Unit
Ω
IS = -10 mA, VD = ±12.5 V,
VIN = 2.4 V,
V+ = +13.5 V, V- = -13.5 V
1
2,3
02 2.5 35
2.5 45
IS(OFF)
IS = -10 mA,
2/
VD = ±12.5 V,
VIN = 0.8 V, 2.4 V,
V+ = +13.5 V, V- = -13.5 V
VD = ±15.5 V,
VS = ±15.5 V, VIN = 2.4 V,
V+ = +16.5 V, V- = -16.5 V
1
2,3
1
2,3
03 2.5 35
2.5 45
01 ±0.25 nA
±20
VD = ±15.5 V,
VS = ±15.5 V, VIN = 0.8 V,
V+ = +16.5 V, V- = -16.5 V
1
2,3
02
±0.25
±20
ID(OFF)
VD = ±15.5 V,
2/
VS = ±15.5 V,
VIN = 0.8 V, 2.4 V,
V+ = +16.5 V, V- = -16.5 V
VD = ±15.5 V,
VS = ±15.5 V, VIN = 2.4 V,
V+ = +16.5 V, V- = -16.5 V
1
2,3
1
2,3
03
01
±0.25
±20
±0.25 nA
±20
VD = ±15.5 V,
VS = ±15.5 V, VIN = 0.8 V,
V+ = +16.5 V, V- = -16.5 V
1
2,3
02
±0.25
±20
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90737
SHEET
5

5 Page





5962-90737 arduino
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be
in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,
subgroups 7 and 8 shall include verifying the truth table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
C
5962-90737
SHEET
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