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Número de pieza | KMM53632004CK | |
Descripción | 32MBx36 DRAM Simm Using 16MBx4 & 16MBx1 | |
Fabricantes | Samsung Semiconductor | |
Logotipo | ||
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No Preview Available ! DRAM MODULE
KMM53632004CK/CKG
4Byte 32Mx36 SIMM
(16Mx4 & 16Mx1 base)
Revision 0.0
June 1999
1 page DRAM MODULE
KMM53632004CK/CKG
ABSOLUTE MAXIMUM RATINGS *
Item
Symbol
Rating
Unit
Voltage on any pin relative to VSS
Voltage on VCC supply relative to VSS
Storage Temperature
Power Dissipation
Short Circuit Output Current
VIN, VOUT
VCC
Tstg
Pd
IOS
-1 to +7.0
-1 to +7.0
-55 to +125
24
50
V
V
°C
W
mA
* Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to
the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for intended
periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS (Voltage referenced to VSS, TA = 0 to 70°C )
Item
Symbol
Min
Typ
Max
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
VCC
4.5
5.0
5.5
VSS 0 0 0
VIH 2.4
- VCC*1
VIL -1.0*2
-
0.8
*1 : VCC+2.0V at pulse width≤20ns, which is measured at VCC.
*2 : -2.0V at pulse width≤20ns, whcih is measured at VSS.
Unit
V
V
V
V
DC AND OPERATING CHARACTERISTICS (Recommended operating conditions unless otherwise noted)
Symbol
Speed
KMM53632004CK/CKG
Min Max
Unit
ICC1
-5
-6
-
-
1344
1224
mA
mA
ICC2
ICC3
Don′t care
-5
-6
-
-
-
48
1344
1224
mA
mA
mA
ICC4
-5
-6
-
-
1224
1104
mA
mA
ICC5
ICC6
Don′t care
-5
-6
-
-
-
24
1344
1224
mA
mA
mA
II(L)
IO(L)
Don′t care
-10
-10
10 uA
10 uA
VOH
VOL
Don′t care
2.4
-
-V
0.4 V
ICC1 : Operating Current * (RAS, CAS, Address cycling @tRC=min)
ICC2 : Standby Current (RAS=CAS=W=VIH)
ICC3 : RAS Only Refresh Current * (CAS=VIH, RAS cycling @tRC=min)
ICC4 : Hyper Page Mode Current * (RAS=VIL, CAS cycling : tHPC=min)
ICC5 : Standby Current (RAS=CAS=W=Vcc-0.2V)
ICC6 : CAS-Before-RAS Refresh Current * (RAS and CAS cycling @tRC=min)
I(IL) : Input Leakage Current (Any input 0≤VIN≤Vcc+0.5V, all other pins not under test=0 V)
I(OL) : Output Leakage Current(Data Out is disabled, 0V≤VOUT≤Vcc)
VOH : Output High Voltage Level (IOH = -5mA)
VOL : Output Low Voltage Level (IOL = 4.2mA)
* NOTE : ICC1, ICC3, ICC4 and ICC6 are dependent on output loading and cycle rates. Specified values are obtained with the output open.
ICC is specified as an average current. In ICC1 and ICC3, address can be changed maximum once while RAS=VIL. In ICC4,
address can be changed maximum once within one EDO mode cycle time, tHPC.
5 Page DRAM MODULE
READ - MODIFY - WRITE CYCLE
KMM53632004CK/CKG
VIH -
RAS
VIL -
VIH -
CAS
VIL -
VIH -
A
VIL -
VIH -
W
VIL -
VIH -
OE
VIL -
VI/OH -
DQ
VI/OL -
tRAS
tRWC
tRP
tCRP
tRCD
tASR
tRAD
tRAH
tASC
tCAH
ROW
ADDR
COLUMN
ADDRESS
tRSH
tCAS
tCSH
tAWD
tCWD
tRWD
tOEA
tRWL
tCWL
tWP
tOLZ
tCLZ
tCAC
tAA
tRAC
tOED
tOEZ
VALID
DATA-OUT
tDS tDH
VALID
DATA-IN
Don′t care
Undefined
11 Page |
Páginas | Total 21 Páginas | |
PDF Descargar | [ Datasheet KMM53632004CK.PDF ] |
Número de pieza | Descripción | Fabricantes |
KMM53632004CK | 32MBx36 DRAM Simm Using 16MBx4 & 16MBx1 | Samsung Semiconductor |
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