PDF ICX285AL Data sheet ( Hoja de datos )

Número de pieza	ICX285AL
Descripción	Progressive Scan CCD Image Sensor with Square Pixel for B/W Cameras
Fabricantes	Sony Corporation
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No Preview Available ! ICX285AL Diagonal 11 mm (Type 2/3) Progressive Scan CCD Image Sensor with Square Pixel for B/W Cameras Description The ICX285AL is a diagonal 11 mm (Type 2/3) interline CCD solid-state image sensor with a square pixel array. High sensitivity and low smear are achieved through the adoption of EXview HAD CCD technology. Progressive scan allows all pixel’s signals to be output independently within approximately 1/15 second. Also, the adoption of high frame rate readout mode supports 60 frames per second. This chip features an electronic shutter with variable charge-storage time which makes it possible to realize full-frame still images without a mechanical shutter. This chip is suitable for image input applications such as still cameras which require high resolution, etc. 20 pin DIP (Ceramic) Features • Progressive scan allows individual readout of the image signals from all pixels. • High horizontal and vertical resolution (both approximately 1024 TV-lines) still images without a mechanical shutter • Supports high frame rate readout mode (effective 256 lines output, 60 frame/s) • Square pixel • Aspect ratio: 4:3 • Horizontal drive frequency: 28.64 MHz • High sensitivity, low smear Pin 1 2 • Low dark current, excellent anti-blooming characteristics • Continuous variable-speed shutter V • Horizontal register: 5.0 V drive Device Structure • Interline CCD image sensor • Image size: Diagonal 11 mm (Type 2/3) 2 Pin 11 H 40 • Total number of pixels: 1434 (H) × 1050 (V) approx. 1.50M pixels Optical black position • Number of effective pixels: 1392 (H) × 1040 (V) approx. 1.45M pixels • Number of active pixels: 1360 (H) × 1024 (V) approx. 1.40M pixels (Top View) • Chip size: 10.2 mm (H) × 8.3 mm (V) • Unit cell size: 6.45 µm (H) × 6.45 µm (V) • Optical black: Horizontal (H) direction: Front 2 pixels, rear 40 pixels Vertical (V) direction: Front 8 pixels, rear 2 pixels • Number of dummy bits: Horizontal 20 Vertical 3 • Substrate material: Silicon 8 * EXview HAD CCD is a trademark of Sony Corporation. EXview HAD CCD is a CCD that drastically improves light efficiency by including near infrared light region as a basic structure of HAD (Hole-Accumulation-Diode) sensor. Sony reserves the right to change products and specifications without prior notice. This information does not convery any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E00Y42A27 1 page ICX285AL Clock Equivalent Circuit Constants Item Symbol Min. Typ. Max. Unit Remarks CφV1 5600 pF CφV2A 6800 pF Capacitance between vertical transfer clock and GND CφV2B 22000 pF CφV3 8200 pF CφV4 22000 pF CφV12A 150 pF CφV12B 390 pF CφV2A3 270 pF Capacitance between vertical transfer clocks CφV2B3 CφV14 470 2200 pF pF CφV34 330 pF CφV2A4 390 pF CφV2B4 560 pF CφH1 Capacitance between horizontal transfer clock and GND CφH2 47 pF 39 pF Capacitance between horizontal transfer clocks CφHH 74 pF Capacitance between reset gate clock and GND CφRG 4 pF Capacitance between substrate clock and GND CφSUB 1300 pF R1, R3 30 Ω Vertical transfer clock series resistor R2A, R2B 32 Ω R4 20 Ω Vertical transfer clock ground resistor RGND 60 Ω Horizontal transfer clock series resistor RφH 7.5 Ω Reset gate clock ground resistor RφRG 24 Ω Vφ4 CφV12B Vφ1 R1 CφV4 CφV41 R4 CφV34 CφV2B4 CφV2B R2B Vφ2B RφH Hφ1 RφH Hφ1 CφHH CφH1 RφH RφH CφH2 Hφ2 Hφ2 CφV1 CφV12A RGND CφV2A4 Vφ2A CφV2A3 R2A CφV2A CφV2B3 CφV3 R3 Vφ3 Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit RGφ RφRG CφRG –5– Reset gate clock equivalent circuit 5 Page ICX285AL • Measurement conditions (1) In the following measurements, the substrate voltage is set to the value indicated on the device, and the device drive conditions are at the typical values of the progressive scan mode, bias and clock voltage condi- tions. (2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical black level (OB) is used as the reference for the signal output, which is taken as the value measured at point [*B] of the measurement system. • Definition of standard imaging conditions (1) Standard imaging condition I: Use a pattern box (luminance: 706 cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0 mm) as an IR cut filter and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the standard sensitivity testing luminous intensity. (2) Standard imaging condition II: This indicates the standard imaging condition I with the IR cut filter removed. (3) Standard imaging condition III: Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens with CM500S (t = 1.0 mm) as an IR cut filter. The luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. 1. Sensitivity 1 Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of 1/100 s, measure the signal output (VS1) at the center of the screen, and substitute the value into the following formula. S1 = VS1 × 100 30 [mV] 2. Sensitivity 2 Set to standard imaging condition II. After selecting the electronic shutter mode with a shutter speed of 1/500 s, measure the signal output (VS2) at the center of the screen, and substitute the value into the following formula. S2 = VS2 × 500 30 [mV] 3. Saturation signal Set to standard imaging condition III. After adjusting the luminous intensity to 20 times the intensity with the average value of the signal output, 200 mV, measure the minimum value of the signal output. 4. Smear Set to standard imaging condition III. With the lens diaphragm at F5.6 to F8, first adjust the luminous intensity to 500 times the intensity with the average value of signal output, 200 mV. Then after the readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure the maximum value (Vsm [mV]) of the signal output and substitute the value into the following formula. Sm = 20 × log Vsm 200 × 1 500 × 1 10 [dB] (1/10 V method conversion value) – 11 – 11 Page

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