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PDF ICX278AL Data sheet ( Hoja de datos )

Número de pieza ICX278AL
Descripción Diagonal 4.5mm (Type 1/4) CCD Image Sensor for EIA B/W Video Cameras
Fabricantes Sony Corporation 
Logotipo Sony Corporation Logotipo



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No Preview Available ! ICX278AL Hoja de datos, Descripción, Manual

ICX278AL
Diagonal 4.5mm (Type 1/4) CCD Image Sensor for EIA B/W Video Cameras
Description
The ICX278AL is an interline CCD solid-state
image sensor suitable for EIA B/W video cameras
with a diagonal 4.5mm (Type 1/4) system. Compared
with the current product ICX208AL, basic
characteristics such as sensitivity, smear and
dynamic range are improved drastically from visible
light region to near infrared light region through the
adoption of EXview HAD CCDTM technology.
This chip features a field period readout system and
an electronic shutter with variable charge-storage time.
The package is a 10mm-square 14-pin DIP (Plastic).
14 pin DIP (Plastic)
Features
Sensitivity in near infrared light region
(+5dB compared with the ICX208AL, λ = 945nm)
High sensitivity (+6dB compared with the ICX208AL, no IR cut filter)
Low smear (–20dB compared with the ICX208AL)
High D range (+2dB compared with the ICX208AL)
Horizontal register: 3.3 to 5V drive
Reset gate:
3.3 to 5V drive
No voltage adjustment
(Reset gate and substrate bias are not adjusted.)
High resolution and low smear
Excellent antiblooming characteristics
Continuous variable-speed shutter
Recommended range of exit pupil distance: –20 to –100mm
Pin 1
2
V
3
Pin 8
H
12
40
Optical black position
(Top View)
Device Structure
Interline CCD image sensor
Image size:
Diagonal 4.5mm (Type 1/4)
Number of effective pixels: 768 (H) × 494 (V) approx. 380K pixels
Total number of pixels: 811 (H) × 508 (V) approx. 410K pixels
Chip size:
4.43mm (H) × 3.69mm (V)
Unit cell size:
4.75µm (H) × 5.55µm (V)
Optical black:
Horizontal (H) direction : Front 3 pixels, rear 40 pixels
Vertical (V) direction : Front 12 pixels, rear 2 pixels
Number of dummy bits: Horizontal 22
Vertical 1 (even fields only)
Substrate material:
Silicon
TM
EXview HAD CCD is a trademark of Sony Corporation.
EXview HAD CCD is a CCD that drastically improves light efficiency by including near infrared light region as a basic structure of
HAD (Hole-Accumulation-Diode) sensor.
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
–1–
E00Z50A3Z

1 page




ICX278AL pdf
ICX278AL
Clock Equivalent Circuit Constant
Item Symbol
Capacitance between vertical transfer clock
and GND
CφV1, CφV3
CφV2, CφV4
CφV12, CφV34
Capacitance between vertical transfer clocks
CφV23, CφV41
CφV13
CφV24
Capacitance between horizontal transfer clock
and GND
CφH1, CφH2
Capacitance between horizontal transfer clocks CφHH
Capacitance between reset gate clock and GND CφRG
Capacitance between substrate clock and GND CφSUB
Vertical transfer clock series resistor
R1, R2, R3, R4
Vertical transfer clock ground resistor
RGND
Horizontal transfer clock series resistor
RφH
Reset gate clock series resistor
RφRG
Min.
Typ.
1200
560
220
120
82
75
22
36
5
180
82
15
12
51
Max.
Unit Remarks
pF
pF
pF
pF
pF
pF
pF
pF
pF
pF
Vφ1
R1
CφV12
Vφ2
R2
CφV41
CφV1
CφV2
CφV23
CφV24
R4
CφV4 RGND CφV3
CφV34
CφV13
R3
RφH
Hφ1
CφH1
CφHH
RφH
Hφ2
CφH2
Vφ4 Vφ3
Vertical transfer clock equivalent circuit
Horizontal transfer clock equivalent circuit
RGφ
RφRG
CφRG
Reset gate clock equivalent circuit
–5–

5 Page





ICX278AL arduino
ICX278AL
4. Smear
Set to standard imaging condition III. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity
to 500 times the intensity with average value of the signal output, 200mV. When the readout clock is
stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure
the maximum value YSm [mV] of the signal output and substitute the value into the following formula.
Sm = 20 × log
VSm
200
×
1
500
×
1
10
[dB] (1/10V method conversion value)
5. Video signal shading
Set to standard imaging condition IV. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity
so that the average value of the signal output is 200mV. Then measure the maximum (Vmax [mV]) and
minimum (Vmin [mV]) values of the signal output and substitute the values into the following formula.
SH = (Vmax – Vmin)/200 × 100 [%]
6. Dark signal
Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60°C and
the device in the light-obstructed state, using the horizontal idle transfer level as a reference.
7. Dark signal shading
After measuring 6, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark
signal output and substitute the values into the following formula.
Vdt = Vdmax – Vdmin [mV]
8. Flicker
Set to standard imaging condition III. Adjust the luminous intensity so that the average value of the signal
output is 200mV, and then measure the difference in the signal level between fields (Vf [mV]). Then
substitute the value into the following formula.
F = (Vf/200) × 100 [%]
9. Lag
Adjust the signal output value generated by strobe light to 200mV. After setting the strobe light so that it
strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following
formula.
Lag = (Vlag/200) × 100 [%]
FLD
V1
Strobe light
timing
Output
Light
Signal output 200mV Vlag (lag)
– 11 –

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