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PDF ICX429ALL Data sheet ( Hoja de datos )
| Número de pieza | ICX429ALL | |
| Descripción | Diagonal 8mm (Type 1/2) CCD Image Sensor for CCIR B/W Video Cameras | |
| Fabricantes | Sony | |
| Logotipo |  |
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ICX429ALL
Diagonal 8mm (Type 1/2) CCD Image Sensor for CCIR B/W Video Cameras
Description
The ICX429ALL is an interline CCD solid-state
image sensor suitable for CCIR B/W video cameras
with a diagonal 8mm (Type 1/2) system. Basic
characteristics such as sensitivity, smear, dynamic
range and S/N are improved drastically through the
adoption of EXview HAD CCDTM technology.
This chip features a field period readout system and
an electronic shutter with variable charge-storage
time. This chip is compatible with the pins of the
ICX249AL and has the same drive conditions.
EXview HAD CCDTM has differrent spectral
characteristics from the curreent CCD.
20 pin DIP (Cer-DIP)
Pin 1
2
Features
V
• High sensitivity
• Low smear
• High D range (+1dB compared with the ICX249AL)
• High S/N
3
Pin 11
H 40
• High resolution and low dark current
• Excellent antiblooming characteristics
• Continuous variable-speed shutter
Optical black position
(Top View)
• Substrate bias: Adjustment free (external adjustment also possible with 6 to 14V)
• Reset gate pulse: 5Vp-p adjustment free (drive also possible with 0 to 9V)
• Horizontal register: 5V drive
12
Device Structure
• Interline CCD image sensor
• Optical size:
Diagonal 8mm (Type 1/2)
• Number of effective pixels: 752 (H) × 582 (V) approx. 440K pixels
• Total number of pixels: 795 (H) × 596 (V) approx. 470K pixels
• Chip size:
7.40mm (H) × 5.95mm (V)
• Unit cell size:
8.6µm (H) × 8.3µm (V)
• Optical black:
Horizontal (H) direction: Front 3 pixels, rear 40 pixels
Vertical (V) direction: Front 12 pixels, rear 2 pixels
• Number of dummy bits: Horizontal 22
Vertical 1 (even fields only)
• Substrate material:
Silicon
TM
∗ EXview HAD CCD is a trademark of Sony Corporation.
EXview HAD CCD is a CCD that drastically improves light efficiency by including near infrared light region as a basic structure of
HAD (Hole-Accumulation-Diode) sensor.
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
–1–
E01510A29
1 page  
ICX429ALL
Clock Voltage Conditions
Item
Symbol
Min.
Typ.
Max. Unit
Waveform
diagram
Remarks
Readout clock voltage VVT
14.55 15.0 15.45 V
1
VVH1, VVH2
–0.05 0 0.05 V
2 VVH = (VVH1 + VVH2)/2
VVH3, VVH4
–0.2 0 0.05 V
2
VVL1, VVL2,
VVL3, VVL4
–9.6 –9.0 –8.5 V
2 VVL = (VVL3 + VVL4)/2
VφV
8.3 9.0 9.65 Vp-p
2
VφV = VVHn – VVLn (n = 1 to 4)
Vertical transfer clock
voltage
| VVH1 – VVH2 |
VVH3 – VVH –0.25
0.1 V
0.1 V
2
2
VVH4 – VVH –0.25
0.1 V
2
VVHH
0.5 V
2 High-level coupling
VVHL
0.5 V
2 High-level coupling
VVLH
0.5 V
2 Low-level coupling
VVLL
0.5 V
2 Low-level coupling
Horizontal transfer
clock voltage
Reset gate clock
voltage∗1
VφH 4.75 5.0
VHL –0.05 0
VRGL
∗1
VφRG
4.5 5.0
VRGLH – VRGLL
5.25 Vp-p
0.05 V
V
5.5 Vp-p
0.8 V
3
3
4
4
4
Low-level coupling
Substrate clock voltage VφSUB
23.0 24.0 25.0 Vp-p
5
∗1 Input the reset gate clock without applying a DC bias. In addition, the reset gate clock can also be driven
with the following specifications.
Item
Reset gate clock
voltage
Symbol
VRGL
VφRG
Min.
Typ.
Max. Unit
Waveform
diagram
–0.2 0 0.2 V
4
8.5 9.0 9.5 Vp-p
4
Remarks
–5–
5 Page 
ICX429ALL
Image Sensor Characteristics Measurement Method
Measurement conditions
1) In the following measurements, the device drive conditions are at the typical values of the bias and clock
voltage conditions. (when used with substrate bias external adjustment, set the substrate voltage to the
value indicated on the device.)
2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical
black level (OB) is used as the reference for the signal output, which is taken as the value of Y signal output
or chroma signal output of the measurement system.
Definition of standard imaging conditions
1) Standard imaging condition I:
Use a pattern box (luminance 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern
for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.4mm) as an IR cut filter and
image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the standard
sensitivity testing luminous intensity.
2) Standard imaging condition II:
This indicates the standard imaging condition I with the IR cut filter removed.
3) Standard imaging condition III:
Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles.
Use a testing standard lens and the luminous intensity is adjusted to the value indicated in each testing
item by the lens diaphragm. (IR cut filter is not spplicable.)
1. Sensitivity1
Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of
1/250s, measure the signal output (VS1) at the center of the screen and substitute the value into the
following formula.
S1 = VS1 ×
250
50
[mV]
2. Sensitivity2
Set to standard imaging condition II. After selecting the electronic shutter mode with a shutter speed of
1/1000s, measure the signal output (VS2) at the center of the screen and substitute the value into the
following formula.
S2
=
VS2
×
1000
50
[mV]
3. Saturation signal
Set to standard imaging condition III. After adjusting the luminous intensity to 10 times the intensity with
average value of the signal output, 200mV, measure the minimum value of the signal output.
– 11 –
11 Page | ||
| Páginas | Total 20 Páginas | |
| PDF Descargar | [ Datasheet ICX429ALL.PDF ] | |
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