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PDF UAA3201T Data sheet ( Hoja de datos )

Número de pieza UAA3201T
Descripción UHF/VHF remote control receiver
Fabricantes Philips 
Logotipo Philips Logotipo



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INTEGRATED CIRCUITS
DATA SHEET
UAA3201T
UHF/VHF remote control receiver
Product specification
Supersedes data of 1995 May 18
File under Integrated Circuits, IC18
2000 Apr 18

1 page




UAA3201T pdf
Philips Semiconductors
UHF/VHF remote control receiver
Product specification
UAA3201T
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOL
VCC
Tamb
Tstg
Ves
PARAMETER
supply voltage
ambient temperature
storage temperature
electrostatic handling voltage
pins OSC and OSE
pins LFB and MIXIN
all other pins
CONDITIONS
note 1
MIN.
0.3
40
55
MAX.
+8.0
+85
+125
2 000
1 500
2 000
+1 500
+2 000
+2 000
Note
1. Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 kseries resistor.
UNIT
V
°C
°C
V
V
V
THERMAL CHARACTERISTICS
SYMBOL
PARAMETER
CONDITIONS
Rth(j-a)
thermal resistance from junction to ambient in free air
VALUE
105
UNIT
K/W
DC CHARACTERISTICS
VCC = 3.5 V; all voltages referenced to VEE; Tamb = 40 to +85 °C; typical value for Tamb = 25 °C; for test circuit
see Fig.9; SAWR disconnected; unless otherwise specified.
SYMBOL
VCC
ICC
VOH(DATA)
VOL(DATA)
PARAMETER
CONDITIONS
supply voltage
supply current
HIGH-level output voltage at
pin DATA
LOW-level output voltage at
pin DATA
R2 = 680
IDATA = 10 µA; note 1
IDATA = +200 µA; note 1
MIN.
TYP.
3.5
3.4
VCC 0.5
0
MAX.
6.0
4.8
VCC
UNIT
V
mA
V
0.6 V
Note
1. IDATA is defined to be positive when the current flows into pin DATA.
2000 Apr 18
5

5 Page





UAA3201T arduino
Philips Semiconductors
UHF/VHF remote control receiver
Product specification
UAA3201T
(1) For test circuit see Fig.9.
SPECTRUM
ANALYZER
INPUT IMPEDANCE
50
TEST CIRCUIT (1)
MED902
Fig.6 Test configuration (spurious radiation).
(1) For test circuit see Fig.9.
GENERATOR 1
50
TEST CIRCUIT (1)
SPECTRUM
ANALYZER
WITH
PROBE
MED903
Fig.7 Test configuration (1 dB compression point).
SIGNAL
GENERATOR
TX data
2000 Apr 18
DEVICE
UNDER TEST
RX data
MASTER
CLOCK
BIT PATTERN
GENERATOR
delayed
TX data
INTEGRATE
AND DUMP
PRESET
DELAY
DATA
COMPARATOR
to error counter
BER TEST BOARD
MED904
Fig.8 BER test facility.
11

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