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PDF N74F257AN Data sheet ( Hoja de datos )

Número de pieza N74F257AN
Descripción Quad 2-line to 1-line selector/multiplexer / non-inverting 3-State
Fabricantes Philips 
Logotipo Philips Logotipo



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No Preview Available ! N74F257AN Hoja de datos, Descripción, Manual

INTEGRATED CIRCUITS
74F257A
Quad 2-line to 1-line selector/multiplexer,
non-inverting (3-State)
Product specification
IC15 Data Handbook
1995 Mar 31
Philips Semiconductors

1 page




N74F257AN pdf
Philips Semiconductors
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
Product specification
74F257A
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH High-level output voltage
VOL Low-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN, IOH = MAX
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
±10%VCC
±5%VCC
±10%VCC
±5%VCC
2.4
2.7
3.3
0.35 0.50
0.35 0.50
V
V
V
V
VIK
II
IIH
IIL
IOZH
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off state output current,
High-level voltage applied
VCC = MIN, II = IIK
VCC = MAX, VI = 7.0V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
–0.73
–1.2
100
20
–0.6
50
V
µA
µA
mA
µA
IOZL
Off state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50 µA
IOS Short-circuit output current3
VCC = MAX
-60
–150
mA
ICCH
9.0 15.0 mA
ICC Supply current4 (total)
ICCL
VCC = MAX
14.5 22.0
mA
ICCZ
15.0 23.0
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Measure ICC with all outputs open and inputs grounded.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST
CONDITION
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
Propagation delay
In to Yn
Propagation delay
S to Yn
Output Enable time
to High or Low level
Output Disable time
from High or Low level
Waveform 1
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
LIMITS
Tamb = +25°C
VCC = +5.0V
CL = 50pF
RL = 500
MIN TYP MAX
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF
RL = 500
MIN MAX
Tamb = –40°C to +85°C
VCC = +5.0V ± 10%
CL = 50pF
RL = 500
MIN MAX
3.0 4.5 6.0
2.0 3.5 5.0
3.0
2.0
7.0
6.0
3.0
2.0
7.0
7.0
5.0 7.5 9.5
4.0 5.5 7.0
5.0
4.0
10.5
8.0
5.0
4.0
10.5
8.5
4.5 6.5 7.5
4.5 6.0 7.5
4.5
4.5
8.5
8.5
4.5
4.5
8.5
8.5
2.0 4.0 5.5
2.0 3.5 5.5
2.0
2.0
6.0
6.0
2.0
2.0
6.0
6.0
UNIT
ns
ns
ns
ns
1995 Mar 31
5

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