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PDF N74F242N Data sheet ( Hoja de datos )
| Número de pieza | N74F242N | |
| Descripción | Quad transceiver / inverting 3-State | |
| Fabricantes | Philips | |
| Logotipo |  |
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INTEGRATED CIRCUITS
74F242
Quad transceiver, inverting (3-State)
74F243
Quad transceiver (3-State)
Product specification
IC15 Data Handbook
1990 Aug 31
Philips
Semiconductors
1 page  
Philips Semiconductors
Transceivers
Product specification
74F242/74F243
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH High-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –3mA
IOL = –15mA
±10%VCC
±5%VCC
±10%VCC
±5%VCC
2.4
2.7
2.0
2.0
3.3
3.2
3.1
V
V
VOL Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH=MAX
±10%VCC
±5%VCC
0.55
0.42 0.55
V
VIK
II
IIH
IIL
IIH+IOZH
Input clamp voltage
Input current at
maximum input voltage
High-level input current
Low-level input current
A0–A3, B0–B3
OEA, OEB
OEA, OEB
only
Off-state output current
High-level voltage applied
VCC = MIN, II = IIK
VCC = MAX, VI = 5.5V
VCC = MAX, VI = 7.0V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
–0.73
–1.2
1
100
20
–1
70
V
mA
µA
µA
mA
µA
IIL+IOZL
Off-state output current
Low-level voltage
applied
74F242
74F243
VCC = MAX, VO = 0.5V
–1.0
mA
–1.6
IOS Short-circuit output current3
VCC = MAX
–100
–225
mA
ICCH
22 35 mA
74F242 ICCL VCC = MAX
40 55 mA
ICC Supply current (total)
ICCZ
ICCH
32 45 mA
64 80 mA
74F243 ICCL VCC = MAX
64 90 mA
ICCZ
71 90 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1990 Aug 30
5
5 Page | ||
| Páginas | Total 10 Páginas | |
| PDF Descargar | [ Datasheet N74F242N.PDF ] | |
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