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PDF MAX1462 Data sheet ( Hoja de datos )

Número de pieza MAX1462
Descripción Low-Voltage / Low-Power / 16-Bit Smart ADC
Fabricantes Maxim Integrated 
Logotipo Maxim Integrated Logotipo



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MAX1462
EVALUATION KIT AVAILABLE
Low-Voltage, Low-Power,
16-Bit Smart ADC
General Description
The MAX1462 implements a revolutionary concept in signal
conditioning, where the output of its 16-bit analog- to-digital
converter (ADC) is digitally corrected over the specified
temperature range. This feature can be readily exploited
by industrial and medical market segments, in applications
such as sensors and smart batteries. Digital correction is
provided by an internal digital signal processor (DSP) and
on-chip 128-bit EEPROM containing user-programmed
calibration coefficients. The conditioned output is available
as a 12-bit digital word and as a ratiometric (proportional to
the supply voltage) analog voltage using an on-board 12-bit
digital-to-analog converter (DAC). The uncommitted op
amp can be used to filter the analog output.
The analog front end includes a 2-bit programmablegain
amplifier (PGA) and a 3-bit coarse-offset (CO) DAC,
which condition the sensor’s output. This coarsely cor-
rected signal is digitized by a 16-bit ADC. The DSP uses
the digitized sensor signal, the temperature sensor, and
correction coefficients stored in the internal EEPROM to
produce the conditioned output.
Multiple or batch manufacturing of sensors is supported with a
completely digital test interface. Built-in testability features on
the MAX1462 result in the integration of three traditional sen-
sor-manufacturing operations into one automated process:
Pretest: Data acquisition of sensor performance
under the control of a host test computer.
Calibration and compensation: Computation and
storage of calibration and compensation coefficients
determined from transducer pretest data.
Final test operation: Verification of transducer cali-
bration and compensation, without removal from the
pretest socket.
The MAX1462 evaluation kit (EV kit) allows fast evaluation
and prototyping, using a piezoresistive transducer (PRT) and
a Windows®-based PC. The user-friendly EV kit simplifies
small-volume prototyping; it is not necessary to understand
fully the test-system interface, the calibration algorithm, or
many other details to evaluate the MAX1462 with a particular
sensor. Plug the PRT into the EV kit, plug the EV kit into a
PC parallel port, connect the sensor to an excitation source
(such as a pressure controller), and run the MAX1462 EV
kit software. An oven is required for thermal compensation.
Functional Diagram appears at end of data sheet.
Pin Configuration appears at end of data sheet.
Windows is a registered trademark of Microsoft Corp.
Features
● Low-Voltage Operation (2.4V to 3.6V)
Low-Noise, 310μA Single-Chip Sensor Signal
Conditioning
● High-Precision Front End Resolves <400nV of
Differential Input Signal
● On-Chip DSP and EEPROM Provide Digital
Correction of Sensor Errors
● 16-Bit Signal Path Compensates Sensor Offset and
Sensitivity and Associated Temperature Coefficients
● 12-Bit Parallel Digital Output
● Analog Output
● Compensates a Wide Range of Sensor Sensitivity
and Offset
● Single-Shot Automated Compensation Algorithm—No
Iteration Required
● Built-In Temperature Sensor
● Three-State, 5-Wire Serial Interface Supports High-
Volume Manufacturing
Applications
● Hand-Held Instruments
● Piezoresistive Pressure and Acceleration
Transducers and Transmitters
● Industrial Pressure Sensors and Calibrators
● Smart Battery Charge Systems
● Weigh Scales and Strain-Gauge Measurement
● Flow Meters
● Dive Computers and Liquid-Level Sensing
● Hydraulic Systems
Ordering Information
PART
MAX1462CCM
TEMP. RANGE
0°C to +70°C
PIN-PACKAGE
48 TQFP
Customization
Maxim can customize the MAX1462 for unique require-
ments. With a dedicated cell library of more than 90 sen-
sor-specific functional blocks, Maxim can quickly provide
customized MAX1462 solutions, including customized
microcode for unusual sensor characteristics and 2.2V
operation. Contact Maxim for further information.
19-1813; Rev 1; 5/14

1 page




MAX1462 pdf
MAX1462
Low-Voltage, Low-Power,
16-Bit Smart ADC
Pin Description (continued)
PIN NAME
FUNCTION
27 D3 Parallel Digital Output - Bit 3
28 D4 Parallel Digital Output - Bit 4
29 D5 Parallel Digital Output - Bit 5
30
OUT
Output DAC. The bitstream on OUT, when externally filtered, creates a ratiometric analog output
voltage. OUT is proportional to the 12-bit parallel digital output.
33 AMPOUT General-Purpose Operational Amplifier Output
34 AMP+ Noninverting Input of General-Purpose Operational Amplifier
35 AMP- Inverting Input of General-Purpose Operational Amplifier
39
XOUT
Internal Oscillator Output. Connect a 2MHz ceramic resonator (Murata CST200) or crystal from XOUT
to XIN.
40
XIN
Internal Oscillator Input. When TEST is high, this input must be driven by the test system with a 2MHz,
50% duty cycle clock signal. The resonator does not need to be disconnected in test mode.
46 INP Positive Sensor Input. Input impedance is typically >1MΩ. Rail-to-Rail® input range.
47
TEST
Test/Program Mode Enable Input. When high, enables the MAX1462 programming/testing operations.
Internally pulled to VSS with a 1MΩ (typ) resistor.
48 INM Negative Sensor Input. Input impedance is typically >1MΩ. Rail-to-Rail input range.
Rail-to-Rail is a registered trademark of Nippon Motorola, Ltd.
Detailed Description
The main functions of the MAX1462 include:
Analog front end: Includes PGA, CO-DAC, ADC, and
temperature sensor.
Test system interface: Writes calibration coefficients
to the DSP registers and EEPROM.
Test system interface: Observes the DSP operation.
The sensor signal enters the MAX1462 and is adjusted
for coarse gain and offset by the analog front end. Five
bits in the configuration register set the CO-DAC and the
coarse gain of the PGA (Tables 1 and 2). These bits must
be properly configured for the optimum dynamic range of
the ADC. The digitized sensor signal is stored in a read-
only DSP register.
The on-chip temperature sensor also has a 3-bit CODAC
that places the temperature signal in the ADC operating
range. Digitized temperature is also stored in a read-only
DSP register. The DSP uses the digitized sensor, the
temperature signals, and the correction coefficients to
calculate the compensated and corrected output.
The MAX1462 supports an automated production envi-
ronment, where a test system communicates with a batch
of MAX1462s and controls temperature and sensor exci-
tation. The three-state digital outputs on the MAX1462
allow parallel connection of transducers, so that all five
serial interface lines (XIN, TEST, RESET, SDIO, and
SDO) can be shared. The test system selects an indi-
vidual transducer using CS1 and CS2. The test system
must vary the sensor’s input and temperature, calculate
the correction coefficients for each unit, load the coef-
ficients into the MAX1462 nonvolatile EEPROM, and test
the resulting compensation.
The MAX1462 DSP implements the following character-
istic equation:
( )D= Gain 1+ G1T + G2T 2 ×
( )Signal+Of0 + Of1T +Of2T 2 + DOFF
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Maxim Integrated 5

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MAX1462 arduino
MAX1462
Low-Voltage, Low-Power,
16-Bit Smart ADC
Table 6. Configuration Register Bitmap
EEPROM
ADDRESS
(HEX)
01
02
03
04
05
06
07
08
09
0A
0B
0C
0D
0E
0F
10
BIT
POSITION
DESCRIPTION
0 (LSB)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15 (MSB)
CO-0 (LSB)
CO-1 (MSB)
CO-S (Sign)
PGA-1 (MSB)
PGA-0 (LSB)
Maxim Reserved
Maxim Reserved
Op Amp Power-Down
Maxim Reserved
TSO-0 (LSB)
TSO-1
TSO-2 (MSB)
Maxim Reserved
Maxim Reserved
Maxim Reserved
Repeat Mode
3) Issue command 0 hex.
The value of VDD should be lowered to its normal operat-
ing values (2.4V to 3.6V) after the EEPROM programming
sequence is completed.
Test System Interface:
Observing the DSP Operation
Test system commands 8 hex and A hex initiate a conver-
sion while allowing the test system to observe the opera-
tion of the DSP. To calibrate a unit, the test system must
know the digitized temperature and sensor signals, stored
in DSP registers 8 and 9, and the calibrated and compen-
sated output stored in DSP register 10. The test system
should also verify the EEPROM contents, registers 0–7.
All these signals pass through DSP register S during the
execution of the instruction ROM microcode. The SDO pin
outputs the S register values, and the SDIO pin tells the
tester which signal is currently on S.
There are three internal DSP registers that are directly
observable on the SDIO and SDO pins:
S: 16-bit DSP Scratch or Accumulator register, con-
taining the result of the execution of the current micro-
code instruction.
P: 8-bit DSP Program Pointer register, which holds the
address of the instruction ROM microcode.
PS: 8-bit DSP Program Store register. PS is the
instruction that the DSP is currently executing. PS is
the instruction ROM data at address P.
The DSP instructions relevant to the test system are listed
in Table 8.
After the test system sends the Start Conversion com-
mands 8 hex or A hex, SDIO and SDO are both enabled
as MAX1462 serial outputs. The test system should
disable (high impedance) its SDIO driver to avoid a bus
conflict at this time so that the MAX1462 can drive the
pin. After the DSP executes each one of the microcode
instructions, the contents of the S, P, and PS registers are
output in a serial format (Figure 4).
A new DSP instruction and a new state of the S, P, and
PS registers are delivered every 16n + 9 clock cycles,
where n = 0, 1, 2... after the Start Conversion command
completes. The tester should latch the SDIO and SDO
bits on the falling edge of the XIN clock signal. When the
P and PS registers in Table 8 appear on SDIO, the tester
should save the corresponding SDO data.
The conversion timing of the MAX1462 is shown in Figure
5 and Table 9. In the figure, the conversion is initiated by
a rising transition on the START pin. Equivalently, conver-
sion can be initiated in TEST mode after completion of
tester commands 8 hex or A hex, or reinitiated by the state
of the Repeat Mode bit in the configuration register. After
a conversion is initiated, the 16-bit ADC digitizes the tem-
perature and sensor signals during tADC. Then, the DSP
executes the instruction ROM microcode during tDSP. In
TEST mode, and during tDSP, SDIO and SDO outputs
carry useful information. At 130,586 clock cycles after the
Start Conversion command is received, the LSB of the S
and P DSP registers is available on SDO and SDIO. The
last DSP instruction is D0 hex. The tester can now start
a new communication sequence by lowering RESET for
at least 16 clock cycles, and then resume driving SDIO.
SDIO becomes high impedance when RESET is low.
Applications Information
Calibration and Compensation Procedure
Perform fine calibration by characterizing the sensor/
MAX1462 pair using the test system and then finding the
calibration coefficients Gain, G1, G2, Of0, Of1, and Of2
using the equations below. This simple fine-calibration
procedure requires three temperatures, denoted A, B, and
C, and two sensor excitations, named S and L for small
and large. Thus, there are six data points (AS, AL, BS, BL,
CS, and CL); six unknown calibration coefficients; and six
versions of the characteristic equation, in the form:
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