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PDF M29F080A Data sheet ( Hoja de datos )
| Número de pieza | M29F080A | |
| Descripción | 8 Mbit 1Mb x8 / Uniform Block Single Supply Flash Memory | |
| Fabricantes | ST Microelectronics | |
| Logotipo |  |
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M29F080A
8 Mbit (1Mb x8, Uniform Block) Single Supply Flash Memory
s SINGLE 5V±10% SUPPLY VOLTAGE for
PROGRAM, ERASE and READ OPERATIONS
s ACCESS TIME: 70ns
s PROGRAMMING TIME
– 8µs by Byte typical
s 16 UNIFORM 64 Kbyte MEMORY BLOCKS
s PROGRAM/ERASE CONTROLLER
– Embedded Byte Program algorithm
– Embedded Multi-Block/Chip Erase algorithm
– Status Register Polling and Toggle Bits
– Ready/Busy Output Pin
s ERASE SUSPEND and RESUME MODES
– Read and Program another Block during
Erase Suspend
s TEMPORARY BLOCK UNPROTECTION
MODE
s LOW POWER CONSUMPTION
– Standby and Automatic Standby
s 100,000 PROGRAM/ERASE CYCLES per
BLOCK
s 20 YEARS DATA RETENTION
– Defectivity below 1 ppm/year
s ELECTRONIC SIGNATURE
– Manufacturer Code: 20h
– Device Code: F1h
TSOP40 (N)
10 x 20mm
44
1
SO44 (M)
Figure 1. Logic Diagram
VCC
20
A0-A19
W
E
G
RP
M29F080A
8
DQ0-DQ7
RB
VSS
AI00501C
April 2000
1/21
1 page  
M29F080A
Output Disable. The Data Inputs/Outputs are in
the high impedance state when Output Enable is
High, VIH.
Standby. When Chip Enable is High, VIH, the
Data Inputs/Outputs pins are placed in the high-
impedance state and the Supply Current is re-
duced to the Standby level.
When Chip Enable is at VIH the Supply Current is
reduced to the TTL Standby Supply Current, ICC2.
To further reduce the Supply Current to the CMOS
Standby Supply Current, ICC3, Chip Enable should
be held within VCC ± 0.2V. For Standby current
levels see Table 10, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, ICC4, for Program or Erase operations un-
til the operation completes.
Automatic Standby. If CMOS levels (VCC ± 0.2V)
are used to drive the bus and the bus is inactive for
150ns or more the memory enters Automatic
Standby where the internal Supply Current is re-
duced to the Standby Supply Current, ICC3. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protection. These bus opera-
tions are intended for use by programming equip-
ment and are not usually used in applications.
They require VID to be applied to some pins.
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying the signals
listed in Table 4, Bus Operations.
Block Protection and Blocks Unprotection. Blocks
can be protected in groups against accidental Pro-
gram or Erase. See Table 3, Block Addresses, for
details of which blocks must be protected together
as a group. Protected blocks can be unprotected
to allow data to be changed. Block Protection and
Block Unprotection operations must only be per-
formed on programming equipment.
For further information refer to Application Note
AN1122, Applying Protection and Unprotection to
M29 Series Flash.
Table 4. Bus Operations
Operation
E GW
Address Inpu ts
Data
Inputs/Outpu ts
Bus Read
VIL VIL VIH Cell Address
Data Output
Bus Write
VIL VIH VIL Command Address
Data Input
Output Disable
X VIH VIH X
Hi-Z
Standby
VIH X
XX
Hi-Z
Read Manufacturer
Code
VIL
VIL
VIH
A0 = VIL, A1 = VIL, A9 = VID,
Others VIL or VIH
20h
Read Device Code
Note: X = VIL or VIH.
VIL
VIL
VIH
A0 = VIH, A1 = VIL, A9 = VID,
Others VIL or VIH
F1h
5/21
5 Page 
Table 8. AC Measurement Conditions
Parameter
AC Test Conditions
Load Capacitance (CL)
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
M29F080A
M29F080A
70 90 / 120
High Speed
Standard
30pF
100pF
≤ 10ns
≤ 10ns
0 to 3V
0.45 to 2.4V
1.5V
0.8V and 2.0V
Figure 6. AC Testing Input Output Waveform
High Speed
3V
0V
Standard
2.4V
0.45V
1.5V
2.0V
0.8V
AI01275B
Figure 7. AC Testing Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF or 100pF
CL includes JIG capacitance
AI03027
Table 9. Capacitance
(TA = 25 °C, f = 1 MHz)
Symbol
Parameter
CIN Input Capacitance
COUT
Output Capacitance
Note: Sampled only, not 100% tested.
Test Condition
VIN = 0V
VOUT = 0V
Min Max Unit
6 pF
12 pF
11/21
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| PDF Descargar | [ Datasheet M29F080A.PDF ] | |
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