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PDF KBMF01SC6 Data sheet ( Hoja de datos )
| Número de pieza | KBMF01SC6 | |
| Descripción | EMI FILTER AND LINE TERMINATION FOR PS/2 MOUSE OR KEYBOARD PORTS | |
| Fabricantes | STMicroelectronics | |
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®
A.S.D.™
KBMFxxSC6
EMI FILTER AND LINE TERMINATION
FOR PS/2 MOUSE OR KEYBOARD PORTS
MAIN APPLICATION
EMI Filter and line termination for mouse and key-
board ports on:
- Desktop computers
- Notebooks
- Workstations
- Servers
DESCRIPTION
On the implementation of computer systems,
the radiated and conducted EMI should be kept
within the required levels as stated by the FCC
regulations. In addition to the requirements of
EMC compatibility, the computing devices are
required to tolerate ESD events and remain
operational without user intervention.
The KBMF implements a low pass filter to limit EMI
levels and provide ESD protection which exceeds
IEC 61000-4-2 level 4 standard. The device also
implements the pull up resistors needed to bias the
data and clock lines. The package is the
SOT23-6L which is ideal for situations where
board space is at a premium.
FEATURES
s Integrated low pass filters for Data and Clock
lines
s Integrated ESD protection
s Integrated pull-up resistors
s Small package size
s Breakdown voltage: VBR = 6V min
SOT23-6L
FUNCTIONAL DIAGRAM
Dat In
Gnd
Clk In
+Vcc
Rp
Rs
CC
+Vcc
Rp
Rs
CC
Dat Out
+Vcc
Clk Out
BENEFITS
s EMI / RFI noise suppression
s ESD protection exceeding IEC61000-4-2 level 4
s High flexibility in the design of high density
boards
code 01
Tolerance
Rs
39Ω
±10%
Rp
4.7kΩ
±10%
C
120pF
±20%
TM: ASD and TRANSIL are trademarks of STMicroelectronics.
February 2002 - Ed : 1D
1/8
1 page  
KBMFxxSC6
Fig. A5: Remaining voltage at both stages S1 (Vinput) and S2 (Voutput) during ESD surge.
a. Positive surge
b. Negative surge
Please note that the KBMFxxSC6 is not only acting for positive ESD surges but also for negative ones. For
these kind of disturbances it clamps close to ground voltage as shown in Fig. A5b.
LATCH-UP PHENOMENA
The early ageing and destruction of IC’s is often due to latch-up phenomena which is mainly induced by
dV/dt. Thanks to its structure, the KBMFxxSC6 provides a high immunity to latch-up phenomena by
smoothing very fast edges.
CROSSTALK BEHAVIOR
Fig. A6: Crosstalk phenomena
RG1
Line 1
VG1
RG2 Line 2
RL1 α1VG1 + β V12 G2
VG2 RL2 α2VG2 + β V21 G1
DRIVERS
RECEIVERS
The crosstalk phenomena is due to the coupling between 2 lines. The coupling factor ( β12 or β21 ) increases
when the gap across lines decreases, this is the reason why we provide crosstalk measurements for
monolithic device to guarantee negligeable crosstalk between the lines. In the example above the ex-
pected signal on load RL2 is α2VG2, in fact the real voltage at this point has got an extra value β21VG1. This
part of the VG1 signal represents the effect of the crosstalk phenomenon of the line 1 on the line 2. This phe-
nomenon has to be taken into account when the drivers impose fast digital data or high frequency analog
signals in the disturbing line. The perturbed line will be more affected if it works with low voltage signal or
high load impedance (few kΩ).
5/8
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| Páginas | Total 8 Páginas | |
| PDF Descargar | [ Datasheet KBMF01SC6.PDF ] | |
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