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PDF TC74VHC174FN Data sheet ( Hoja de datos )

Número de pieza TC74VHC174FN
Descripción HEX D-TYPE FLIP-FLOP WITH CLEAR
Fabricantes Toshiba 
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No Preview Available ! TC74VHC174FN Hoja de datos, Descripción, Manual

TC74VHC174F/FN/FT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VHC174F,TC74VHC174FN,TC74VHC174FT
Hex D-Type Flip Flop with Clear
The TC74VHC174 is an advanced high speed CMOS HEX
D-TYPE FLIP FLOP fabricated with silicon gate C2MOS
technology.
It achieves the high speed operation similar to equivalent
Bipolar Schottky TTL while maintaining the CMOS low power
dissipation.
Information signals applied to D inputs are transferred to the
Q output on the positive going edge of the clock pulse.
When the CLR input is held low, the Q output are in the low
logic level independent of the other inputs.
An input protection circuit ensures that 0 to 5.5 V can be
applied to the input pins without regard to the supply voltage.
This device can be used to interface 5 to 3 V systems and two
supply systems such as battery back up. This circuit prevents
device destruction due to mismatched supply and input voltages.
Features
High speed: fmax = 150 MHz (typ.) at VCC = 5 V
Low power dissipation: ICC = 4 µA (max) at Ta = 25°C
High noise immunity: VNIH = VNIL = 28% VCC (min)
Power down protection is provided on all inputs.
Balanced propagation delays: tpLH ∼− tpHL
Wide operating voltage range: VCC (opr) = 2 to 5.5 V
Low noise: VOLP = 0.8 V (max)
Pin and function compatible with 74ALS174
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC74VHC174F
TC74VHC174FN
TC74VHC174FT
Weight
SOP16-P-300-1.27A
SOP16-P-300-1.27
SOL16-P-150-1.27
TSSOP16-P-0044-0.65A
: 0.18 g (typ.)
: 0.18 g (typ.)
: 0.13 g (typ.)
: 0.06 g (typ.)
1 2006-02-01

1 page




TC74VHC174FN pdf
TC74VHC174F/FN/FT
AC Characteristics (input: tr = tf = 3 ns)
Characteristics
Symbol
Propagation delay
time
(CK-Q)
tpLH
tpHL
Propagation delay
time
( CLR -Q)
tpHL
Maximum clock
frequency
fmax
Output to output skew
Input capacitance
Power dissipation
capacitance
tosLH
tosHL
CIN
CPD
Test Condition
VCC (V)
3.3 ± 0.3
5.0 ± 0.5
3.3 ± 0.3
5.0 ± 0.5
3.3 ± 0.3
5.0 ± 0.5
3.3 ± 0.3
(Note 1)
5.5 ± 0.5
CL (pF)
15
50
15
50
15
50
15
50
15
50
15
50
50
50
Ta = 25°C
Min Typ. Max
7.2 11.0
9.7 14.5
4.9 7.2
6.4 9.2
7.4 11.4
9.9 14.9
5.1 7.6
6.6 9.6
95 150
55 85
130 175
90 120
― ― 1.5
― ― 1.0
4 10
(Note 2) 29
Ta = 40 to
85°C
Min Max
1.0 13.0
1.0 16.5
1.0 8.5
1.0 10.5
1.0 13.5
1.0 17.0
1.0 9.0
1.0 11.0
80
50
110
80
1.5
1.0
10
――
Unit
ns
ns
MHz
ns
pF
pF
Note 1: Parameter guaranteed by design.
tosLH = |tpLHm tpLHn|, tosHL = |tpHLm tpHLn|
Note 2: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD·VCC·fIN + ICC/6 (per F/F)
And the total CPD when n pcs. of flip flop operate can be gained by the follwing eguation:
CPD (total) = 19 + 10·n
Noise Characteristics (input: tr = tf = 3 ns)
Characteristics
Symbol
Test Condition
Quiet output maximum dynamic VOL
Quiet output minimum dynamic VOL
Minimum high level dynamic input voltage
Maximum low level dynamic input voltage
VOLP
VOLV
VIHD
VILD
CL = 50 pF
CL = 50 pF
CL = 50 pF
CL = 50 pF
VCC (V)
5.0
5.0
5.0
5.0
Ta = 25°C
Typ. Max
0.4 0.8
0.4 0.8
3.5
1.5
Unit
V
V
V
V
5 2006-02-01

5 Page





TC74VHC174FN arduino
TC74VHC174F/FN/FT
Note: Lead (Pb)-Free Packages
SOP16-P-300-1.27A SOL16-P-150-1.27 TSSOP16-P-0044-0.65A
RESTRICTIONS ON PRODUCT USE
The information contained herein is subject to change without notice. 021023_D
060116EBA
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc. 021023_A
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk. 021023_B
The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations. 060106_Q
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others. 021023_C
The products described in this document are subject to the foreign exchange and foreign trade laws. 021023_E
11 2006-02-01

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