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PDF UPD17P218 Data sheet ( Hoja de datos )
| Número de pieza | UPD17P218 | |
| Descripción | 4-BIT SINGLE-CHIP MICROCONTROLLER FOR INFRARED REMOTE CONTROLLER | |
| Fabricantes | NEC | |
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DATA SHEET
MOS INTEGRATED CIRCUIT
µPD17P218
4-BIT SINGLE-CHIP MICROCONTROLLER
FOR INFRARED REMOTE CONTROLLER
DESCRIPTION
The µPD17P218 is a model of the µPD17218 with a one-time PROM instead of an internal mask ROM.
5
Since the user can write programs to the µPD17P218, it is ideal for experimental production or small-scale
production of the µPD17215, 17216, 17217 or 17218 systems.
When reading this document, also read the documents related to the µPD17215, 17216, 17217 and 17218.
Detailed functions are described in the following user’s manual. Read this manual when designing your
system.
µPD172×× Series User’s Manual: IEU-1317
FEATURES
• Pin compatible with µPD17215, 17216, 17217 and 17218 (except PROM programming function)
• Carrier generator circuit for infrared remote controller (REM output)
• 17K architecture: General-purpose register method
• Program memory (one-time PROM): 16K bytes (8192 × 16)
• Data memory (RAM): 223 × 4 bits
• Pull-up resistor can be connected to RESET pinNote.
• Low-voltage detection circuit (WDOUT output)Note
• Operating voltage range: 2.0 to 5.5 V (fx = 4 MHz: normal mode, 8 µs)
2.2 to 5.5 V (fx = 4 MHz: high-speed mode, 4 µs)
3.5 to 5.5 V (fx = 8 MHz: high-speed mode, 2 µs)
Note: Can be selected by mask option with the mask model.
APPLICATIONS
Preset remote controllers, toys, and portable systems
ORDERING INFORMATION
Part Number
µPD17P218GT
µPD17P218CT
Package
28-pin plastic SOP (375 mil)
28-pin plastic shrink DIP (400 mil)
Quality Grade
Standard
Standard
Please refer to “Quality Grade on NEC Semiconductor Devices” (Document number IEI-1209) published by NEC
Corporation to know the specification of quality grade on the devices and its recommended applications.
Document No. IC - 3252
(O. D. No. IC - 8797)
Date Published September 1994 P
Printed in Japan
The information in this document is subject to change without notice.
The mark 5 shows major revised points.
© 1994
1 page  
CONTENTS
µPD17P218
1. DIFFERENCES BETWEEN µPD17P218 AND µPD17215/17216/17217/17218 .................................. 6
2. PIN FUNCTIONS ................................................................................................................................. 7
2.1 IN NORMAL MODE ................................................................................................................................ 7
2.2 IN PROM PROGRAMMING MODE ........................................................................................................ 8
2.3 PIN I/O CIRCUITS ................................................................................................................................... 8
2.4 PROCESSING OF UNUSED PINS .......................................................................................................... 11 5
2.5 NOTES ON USING INT AND RESET PINS ........................................................................................... 11 5
3. WRITING/VERIFYING ONE-TIME PROM (PROGRAM MEMORY) .................................................. 12
3.1 OPERATION MODE FOR WRITING/VERIFICATION OF PROGRAM MEMORY .................................. 12
3.2 PROGRAM MEMORY WRITE PROCEDURE ......................................................................................... 13
3.3 PROGRAM MEMORY READ PROCEDURE ........................................................................................... 14
4. ELECTRICAL SPECIFICATIONS (PRELIMINARY) ........................................................................... 15
5. PACKAGE DRAWINGS .................................................................................................................... 23
6. RECOMMENDED SOLDERING CONDITIONS ................................................................................ 25 5
APPENDIX A. FUNCTION OF µPD17215 SUB-SERIES PRODUCTS ................................................. 26
APPENDIX B. DEVELOPMENT TOOLS ............................................................................................... 27
5
5 Page 
µPD17P218
2.4 PROCESSING OF UNUSED PINS
Process the unused pins as follows:
Table 2-1 Processing of Unused Pins
Pin
P0A0-P0A3
P0B0-P0B3
P0C0-P0C3
P0D0-P0D3
P0E0-P0E3
REM
INT
WDOUT
Recommended Connection
Connect to VDD
Connect to VDD
Connect to GND
Connect to GND
Input : Connect to VDD or GND
Output : Open
Open
Connect to GND
Connect to GND
5
2.5 NOTES ON USING INT AND RESET PINS
5
In addition to the functions shown in 2 PIN FUNCTIONS, the INT and RESET pins also have a function to set a
test mode (for IC testing) in which the internal operations of the µPD17P218 are tested.
When a voltage higher than VDD is applied to either of these pins, the test mode is set. This means that, even
during normal operation, the µPD17P218 may be set in the test mode and malfunction if a noise exceeding VDD is
applied.
For example, if the wiring length of the INT or RESET pin is too long, noise superimposed on the wiring line of
the pin may cause the above problem.
Therefore, keep the wiring length of these pins as short as possible to suppress the noise; otherwise, take noise
preventive measures as shown below by using external components.
• Connect diode with low VF between VDD
and INT/RESET pin
• Connect capacitor between VDD
and INT/RESET pin
V DD
V DD
Diode with
low V F
V DD
INT, RESET
V DD
INT, RESET
Moreover, if the test mode is set by the INT pin, low level is output from the WDOUT pin. In this case, connect
the WDOUT pin to the RESET pin.
11
11 Page | ||
| Páginas | Total 30 Páginas | |
| PDF Descargar | [ Datasheet UPD17P218.PDF ] | |
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