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PDF PCA9513 Data sheet ( Hoja de datos )
| Número de pieza | PCA9513 | |
| Descripción | Hot swappable IC and SMBus bus buffer | |
| Fabricantes | Integrated Circuit Systems | |
| Logotipo |  |
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INTEGRATED CIRCUITS
PCA9513; PCA9514
Hot swappable I2C and SMBus bus buffer
Product data sheet
Supersedes data of 2004 Jan 07
2004 Oct 05
Philips
Semiconductors
1 page  
Philips Semiconductors
Hot swappable I2C and SMBus bus buffer
Product data sheet
PCA9513; PCA9514
TYPICAL APPLICATION — PCA9514
VCC
(2.7 V to
5.5 V)
R1
10 kΩ
SCLIN
R2
10 kΩ 8
3
C1
0.01 µF R5
10 kΩ
R3
10 kΩ
2
R4
10 kΩ
SCLOUT
SDAIN
67
SDAOUT
ENABLE
BLOCK DIAGRAM — PCA9514
SDAIN 6
SLEW RATE
DETECTOR
CONNECT
1
ENABLE
5
READY
GND
4
Figure 4. Typical application — PCA9514
2 mA
BACKPLANE-TO-CARD
CONNECTION
2 mA
SLEW RATE
DETECTOR
CONNECT
PCA9514
SW02160
8 VCC
7 SDAOUT
SCLIN 3
SLEW RATE
DETECTOR
CONNECT
0.55VCC/
0.45VCC
UVLO
ENABLE 1
130 µs
DELAY
2004 Oct 05
2 mA
BACKPLANE-TO-CARD
CONNECTION
2 mA
SLEW RATE
DETECTOR
CONNECT
2 SCLOUT
0.55VCC/
0.45VCC
STOP BIT AND
BUS IDLE
0.5 µA
20 pF
UVLO
0.5 pF
Figure 5. Block diagram — PCA9514
5
CONNECT
RD
QB
S
5 READY
4 GND
CONNECT
SW02161
5 Page 
Philips Semiconductors
Hot swappable I2C and SMBus bus buffer
Product data sheet
PCA9513; PCA9514
ABSOLUTE MAXIMUM RATINGS
Limiting values in accordance with the Absolute Maximum System (IEC 134).
Voltages with respect to pin GND.
LIMITS
SYMBOL
PARAMETER
MIN.
MAX.
UNIT
VCC Supply voltage range VCC
–0.5 +7 V
Vn SDAIN, SCLIN, SDAOUT, SCLOUT, READY, ENABLE
–0.5 +7 V
II Maximum current for inputs
– ±20 mA
IIO Maximum current for I/O pins
– ±50 mA
Topr Operating temperature range
–40 +85 °C
Tstg Storage temperature range
–65
+125
°C
Tsld Lead soldering temperature (10 sec max)
—
+300
°C
Tj(max)
Maximum junction temperature
—
+125
°C
NOTE:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2004 Oct 05
11
11 Page | ||
| Páginas | Total 20 Páginas | |
| PDF Descargar | [ Datasheet PCA9513.PDF ] | |
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