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PDF Z86250 Data sheet ( Hoja de datos )

Número de pieza Z86250
Descripción STARSIGHT DATABASEENGINE
Fabricantes Zilog. 
Logotipo Zilog. Logotipo



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No Preview Available ! Z86250 Hoja de datos, Descripción, Manual

Z86250
CP96TEL0302
CUSTOMERPROCUREMENTSPECIFICATION
FEATURES
s Part
Z86250
Package
84-Pin PLCC
Speed (MHz)
24
s 4.3- to 5.5-Volt Operating Range
s 0°C to +70°C Temperature Range
s Low-Power Consumption
s Segmented Base Registers
Z86250
STARSIGHTDATABASEENGINE
s Infrared Receiver Logic
s CRC-32 Encoding and Decoding Logic
s Watch-Dog Timer (WDT) for Error Recovery
s Serial I.M. and I2C Compatible Bus for External
Communication
s Test Multiplexer for Chip Debug
GENERAL DESCRIPTION
Zilog's Z86250 StarSight Data Base Engine (DBE) is
designed to process extracted data for the StarSight
on-screen programming guide. The device is logically
equivalent to the DBE1200 for StarSight applications.
The Z86250 provides a number of important peripheral
functions, such as the IR Blaster to send command signals
to the VCR, and low-power management to avoid loss of
data.
For fast memory data manipulation, the Z86250 offers
segmented base registers. The device also features
PSRAM memory control and refresh logic.
The DBE is optimized to work with Zilog's Z89300 series of
TV controller devices to provide a cost-effective solution
for StarSight programming-guide data extraction and
display.
Notes:
All Signals with a preceding front slash, "/", are active Low, e.g.:
B//W (WORD is active Low); /B/W (BYTE is active Low, only).
Power connections follow conventional descriptions below:
Connection
Power
Ground
Circuit
VCC
GND
Device
VDD
V
SS
CP96TEL0302 (2/96)
1

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Z86250 pdf
ABSOLUTE MAXIMUM RATINGS
Z86250
CP96TEL0302
Symbol
VDD
TA
TS
Parameter
Power Supply Voltage
Operating Ambient Temp.
Storage Temperature
Min
–0.3
0
–65
Max
7
70
150
Units
V
°C
°C
Conditions
All pins with respect to GND
Stress greater than those listed under Absolute Maximum
Ratings may cause permanent damage to the device. This
is a stress rating only; operation of the device at any
condition above those indicated in the operational sec-
tions of these specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
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