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PDF SCAN18245T Data sheet ( Hoja de datos )
| Número de pieza | SCAN18245T | |
| Descripción | Non-Inverting Transceiver with TRI-STATE Outputs | |
| Fabricantes | National Semiconductor | |
| Logotipo |  |
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September 1998
SCAN18245T
Non-Inverting Transceiver with TRI-STATE® Outputs
General Description
The SCAN18245T is a high speed, low-power bidirectional
line driver featuring separate data inputs organized into dual
9-bit bytes with byte-oriented output enable and direction
control signals. This device is compliant with IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture
with the incorporation of the defined boundary-scan test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), and Test
Clock (TCK).
Features
n IEEE 1149.1 (JTAG) Compliant
n Dual output enable control signals
n TRI-STATE outputs for bus-oriented applications
n 9-bit data busses for parity applications
n Reduced-swing outputs source 24 mA/sink 48 mA
n Guaranteed to drive 50Ω transmission line to TTL input
levels of 0.8V and 2.0V
n TTL compatible inputs
n 25 mil pitch Cerpack package
n Includes CLAMP and HIGHZ instructions
n Available as Known Good Die
n Standard Microcircuit Drawing (SMD) 5962-9311501
Connection Diagram
Pin Names
B1(0–8)
A2(0–8)
B2(0–8)
G1, G2
DIR1, DIR2
Description
Side B1 Inputs or TRI-STATE Outputs
Side A2 Inputs or TRI-STATE Outputs
Side B2 Inputs or TRI-STATE Outputs
Output Enable Pins
Direction of Data Flow Pins
DS100320-1
Pin Names
Description
A1(0–8)
Side A1 Inputs or TRI-STATE Outputs
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 1998 National Semiconductor Corporation DS100320
www.national.com
1 page  
Description of Boundary-Scan Circuitry (Continued)
Scan Cell TYPE1
Scan Cell TYPE2
DS100320-7
DS100320-8
5 www.national.com
5 Page 
AC Electrical Characteristics
Scan Test Operation
Symbol
Parameter
VCC
(V)
(Note 7)
Military
TA=−55˚C to +125˚C
CL = 50 pF
Min Max
tPLH,
tPHL
tPLZ,
tPHZ
tPZL,
tPZH
tPLH,
tPHL
tPLH,
tPHL
tPLH,
tPHL
tPLZ,
tPHZ
tPLZ,
tPHZ
tPLZ,
tPHZ
tPZL,
tPZH
tPZL,
tPZH
Propagation Delay
TCK to TDO
Disable Time
TCK to TDO
Enable Time
TCK to TDO
Propagation Delay
TCK to Data Out
During Update-DR
State
Propagation Delay
TCK to Data Out
During Update-IR
State
Propagation Delay
TCK to Data Out
During Test Logic
Reset State
Propagation Delay
TCK to Data Out
During Update-DR
State
Propagation Delay
TCK to Data Out
During Update-IR
State
Propagation Delay
TCK to Data Out
During Test Logic
Reset State
Propagation Delay
TCK to Data Out
During Update-DR
State
Propagation Delay
TCK to Data Out
During Update-IR
State
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
5.0
2.8
2.8
2.0
2.0
2.4
2.4
4.0
4.0
4.0
4.0
4.4
4.4
3.2
3.2
2.8
2.8
2.8
2.8
4.0
4.0
3.2
3.2
15.8
15.8
12.8
12.8
16.7
16.7
21.7
21.7
21.2
21.2
23.0
23.0
19.6
19.6
20.9
20.9
21.8
21.8
22.6
22.6
23.7
23.7
tPZL,
tPZH
Propagation Delay
TCK to Data Out
During Test Logic
Reset State
5.0
3.6
3.6
24.9
24.9
Note 6: All Propagation Delays involving TCK are measured from the falling edge of TCK.
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
11 www.national.com
11 Page | ||
| Páginas | Total 16 Páginas | |
| PDF Descargar | [ Datasheet SCAN18245T.PDF ] | |
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