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PDF IDT7034L15PF Data sheet ( Hoja de datos )

Número de pieza IDT7034L15PF
Descripción HIGH-SPEED 4K x 18 DUAL-PORT STATIC RAM
Fabricantes Integrated Device Technology 
Logotipo Integrated Device Technology Logotipo



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No Preview Available ! IDT7034L15PF Hoja de datos, Descripción, Manual

HIGH-SPEED
4K x 18 DUAL-PORT
STATIC RAM
IDT7034S/L
Features:
x True Dual-Ported memory cells which allow simultaneous
reads of the same memory location
x High-speed access
— Commercial: 15/20ns (max.)
x Low-power operation
— IDT7034S
Active: 850mW (typ.)
Standby: 5mW (typ.)
— IDT7034L
Active: 850mW (typ.)
Standby: 1mW (typ.)
x Separate upper-byte and lower-byte control for multiplexed
bus compatibility
x IDT7034 easily expands data bus width to 36 bits or more
using the Master/Slave select when cascading more than
one device
x M/S = H for BUSY output flag on Master
M/S = L for BUSY input on Slave
x Interrupt Flag
x On-chip port arbitration logic
x Full on-chip hardware support of semaphore signaling
between ports
x Fully asynchronous operation from either port
x Battery backup operation—2V data retention
x TTL-compatible, single 5V (±10%) power supply
x Available in 100-pin Thin Quad Flatpack
x Industrial temperature range (–40°C to +85°C) is available
for selected speeds
Functional Block Diagram
R/WL
UBL
R/WR
UBR
LBL
CEL
OEL
LBR
CER
OER
I/O9L-I/O17L
I/O0L-I/O8L
BUSYL(1,2)
I/O
Control
I/O
Control
A11L
A0L
Address
Decoder
13
CEL
OEL
R/WL
MEMORY
ARRAY
ARBITRATION
INTERRUPT
SEMAPHORE
LOGIC
13
SEML
INTL(2)
NOTES:
1. (MASTER): BUSY is output; (SLAVE): BUSY is input.
2. BUSY outputs and INT outputs are non-tri-stated push-pull.
M/S
Address
Decoder
CER
OER
R/WR
I/O9R-I/O17R
.
I/O0R-I/O8R
BUSYR(1,2)
A11R
A0R
SEMR
INTR(2)
4089 drw 01
©1999 Integrated Device Technology, Inc.
SEPTEMBER 1999
1
DSC 4089/6

1 page




IDT7034L15PF pdf
IDT7034S/L
High-Speed 4K x 18 Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range (VCC = 5.0V ± 10%)
7034S
7034L
Symbol
Parameter
Test Conditions
Min. Max. Min. Max. Unit
|ILI| Input Leakage Current(1)
VCC = 5.5V, VIN = 0V to VCC
___ 10 ___
5 µA
|ILO| Output Leakage Current
CE = VIH, VOUT = 0V to VCC
___ 10 ___
5 µA
VOL Output Low Voltage
IOL = 4mA
___ 0.4 ___ 0.4 V
VOH Output High Voltage
IOH = -4mA
2.4 ___ 2.4 ___ V
NOTE:
1. At VCC < 2.0V input leakages are undefined.
4089 tbl 08
DC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(1,6) (VCC = 5.0V ± 10%)
7034X15
Com'l Only
7034X20
Com'l Only
Symbol
Parameter
Test Condition
Version
Typ.(2) Max. Typ.(2) Max. Unit
ICC Dynamic Operating Current CE = VIL, Outputs Open
(Both Ports Active)
SEM = VIH
f = fMAX(3)
COM'L S 170 310 160 290 mA
L 170 260 160 240
IND S 170 390 160 370
L 170 330 160 320
ISB1 Standby Current
(Both Ports - TTL Level
Inputs)
CEL = CER = VIH
SEMR = SEML = VIH
f = fMAX(3)
COM'L
S 20
60
20
60 mA
L 20 50 20 50
IND S 20 90 20 90
L 20 70 20 70
ISB2 Standby Current
CE"A" = VIL and CE"B" = VIH(5)
(One Port - TTL Level Inputs) Active Port Outputs Open,
f=fMAX(3)
SEMR = SEML = VIH
ISB3 Full Standby Current (Both Both Ports CEL and
Ports - All CMOS Level
CER > VCC - 0.2V
Inputs)
VIN > VCC - 0.2V or
VIN < 0.2V, f = 0(4)
SEMR = SEML > VCC - 0.2V
COM'L
S 105
190
95
180 mA
L 105
160
95
150
IND
S 105
250
95
240
L 105
220
95
210
COM'L
S 1.0
15
1.0
15 mA
L 0.2 5 0.2 5
IND S 1.0 30 1.0 30
L 0.2 10 0.2 10
ISB4 Full Standby Current
CE"A" < 0.2V and
(One Port - All CMOS Level CE"B" > VCC - 0.2V(5)
Inputs)
SEMR = SEML > VCC - 0.2V
VIN > VCC - 0.2V or VIN < 0.2V
Active Port Outputs Open
f = fMAX(3)
COM'L
S 100
170
90
155 mA
L 100
140
90
130
IND
S 100
245
90
225
L 100
210
90
200
NOTES:
1. 'X' in part numbers indicates power rating (S or L)
2. VCC = 5V, TA = +25°C, and are not production tested. Icc dc = 120mA (TYP)
3. At f = fMAX, address and I/O'S are cycling at the maximum frequency read cycle of 1/tRC, and using “AC Test Conditions” of input levels of GND to 3V.
4. f = 0 means no address or control lines change.
5. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
6. Industrial temperature: for specific speeds, packages and powers contact your sales office.
4089 tbl 09
6.542

5 Page





IDT7034L15PF arduino
IDT7034S/L
High-Speed 4K x 18 Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(6,7)
7034X15
Com'l Only
7034X20
Com'l Only
Symbol
Parameter
BUSY TIMING (M/S=VIH)
tBAA BUSY Access Time from Address Match
tBDA BUSY Disable Time from Address Not Matched
tBAC BUSY Acce ss Time from Chip Enable Low
tBDC BUSY Acce ss Time from Chip Enable High
Min. Max. Min. Max. Unit
____ 15 ____ 20 ns
____ 15 ____ 20 ns
____ 15 ____ 20 ns
____ 15 ____ 17 ns
tAPS Arbitration Priority Set-up Time(2)
5 ____ 5 ____ ns
tBDD BUSY Disable to Valid Data(3)
____ 18 ____ 30 ns
tWH Write Hold After BUSY(5)
BUSY TIMING (M/S=VIL)
12 ____ 15 ____ ns
tWB BUSY Input to Write(4)
0 ____ 0 ____ ns
tWH Write Hold After BUSY(5)
12 ____ 15 ____ ns
PORT-TO-PORT DELAY TIMING
tWDD Write Pulse to Data Delay(1)
____ 30 ____ 45 ns
tDDD Write Data Valid to Read Data Delay(1)
____ 25 ____ 30 ns
NOTES:
4089 tbl 14
1. Port-to-port delay through RAM cells from writing port to reading port, refer to "Timing Waveform of Read With BUSY (M/S = VIH)" or "Timing Waveform of Write With
Port-To-Port Delay (M/S = VIH)".
2. To ensure that the earlier of the two ports wins.
3. tBDD is a calculated parameter and is the greater of 0ns, tWDD – tWP (actual) or tDDD – tDW (actual).
4. To ensure that the write cycle is inhibited on Port "B" during contention with Port "A".
5. To ensure that a write cycle is completed on Port "B" after contention with Port "A".
6. 'X' in part numbers indicates power rating (S or L).
7. Industrial temperature: for specific speeds, packages and powers contact your sales office.
61.412

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