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Número de pieza | 100364 | |
Descripción | Low Power 16-Input Multiplexer | |
Fabricantes | National Semiconductor | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de 100364 (archivo pdf) en la parte inferior de esta página. Total 8 Páginas | ||
No Preview Available ! August 1998
100364
Low Power 16-Input Multiplexer
General Description
The 100364 is a 16-input multiplexer. Data paths are con-
trolled by four Select lines (S0–S3). Their decoding is shown
in the truth table. Output data polarity is the same as the se-
leted input data. All inputs have 50 kΩ pulldown resistors.
Features
n 35% power reduction of the 100164
n 2000V ESD protection
n Pin/function compatible with 100164
n Voltage compensated operating range = −4.2V to −5.7V
n Available to industrial grade temperature range
n Standard Microcircuit Drawing
(SMD) 5962-9459201
Logic Symbol
Pin Names
I0– I15
S0– S3
Z
Description
Data Inputs
Select Inputs
Data Output
Connection Diagrams
24-Pin DIP
DS100301-1
24-Pin Quad Cerpak
DS100301-2
DS100301-3
© 1998 National Semiconductor Corporation DS100301
www.national.com
1 page AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = 25˚C
Min Max
TC = +125˚C Units Conditions
Min Max
Notes
tPLH
tPHL
Propagation Delay
I0–I15 to Output
0.50 2.60 0.60 2.40 0.60 2.80 ns Figures 1, (Notes 7,
2 8, 9)
tPLH Propagation Delay
0.70 3.30 0.90 3.10 1.00 3.50 ns
tPHL
S0, S1 to Output
tPLH Propagation Delay
0.50 2.90 0.70 2.60 0.60 3.00 ns
tPHL
S2, S3 to Output
tTLH Transition Time
0.20 1.20 0.20 1.20 0.20 1.20
ns
tTHL 20% to 80%, 80% to 20%
(Note 10)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each Mfg. lot at +25˚C, Subgroup A9, and at +125˚C, and −55˚C temp., Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).
Test Circuit
FIGURE 1. AC Test Circuit
DS100301-6
5 www.national.com
5 Page |
Páginas | Total 8 Páginas | |
PDF Descargar | [ Datasheet 100364.PDF ] |
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