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PDF CD4503BMS Data sheet ( Hoja de datos )
| Número de pieza | CD4503BMS | |
| Descripción | CMOS Hex Buffer | |
| Fabricantes | Intersil Corporation | |
| Logotipo |  |
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CD4503BMS
December 1992
File Number 3335
CMOS Hex Buffer
CD4503BMS is a hex noninverting buffer with 3 state
outputs having high sink and source current capability. Two
disable controls are provided, one of which controls four
buffers and the other controls the remaining two buffers.
The CD4503BMS is supplied in these 16-lead outline packages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
H4T
H1E
H6W
Pinout
CD4503BMS
TOP VIEW
DIS A 1
D1 2
Q1 3
D2 4
Q2 5
D3 6
Q3 7
VSS 8
16 VDD
15 DIS B
14 D6
13 DQ6
12 D5
11 Q5
10 D4
9 Q4
Features
• High Voltage Type (20V Rating)
• 3 State Non-Inverting Type
• 1 TTL Load Output Drive Capability
• 2 Output Disable Controls
• 3 State Outputs
• Pin Compatible with Industry Types MM80C97,
MC14503, and 340097
• 5V, 10V and 15V Parametric Ratings
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25oC
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• 3 State Hex Buffer for Interfacing ICs with Data Buses
• COS/MOS to TTL Hex Buffer
Functional Diagram
1
DISABLE A
2
D1
4
D2
6
D3
10
D4
12
D5
14
D6
15
DISABLE B
VDD = 16
VSS = 8
3 Q1
5 Q2
7 Q3
9 Q4
11 Q5
13 Q6
4-1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
1 page  
CD4503BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
Static Burn-In 1
(Note 1)
OPEN
3, 5, 7, 9, 11, 13
GROUND
1, 2, 4, 6, 8,10, 12,
14, 15
VDD
16
9V ± -0.5V
50kHz
25kHz
Static Burn-In 2 3, 5, 7, 9, 11, 13 8 1, 2, 4, 6, 10, 12,
(Note 1)
14-16
Dynamic Burn-
In (Note 1)
-
1, 8, 15
16 3, 5, 7, 9, 11, 13 2, 4, 6, 10, 12, 14
Irradiation
3, 5, 7, 9, 11, 13
8
1, 2, 4, 6, 10, 12,
(Note 2)
14-16
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
4-5
5 Page | ||
| Páginas | Total 8 Páginas | |
| PDF Descargar | [ Datasheet CD4503BMS.PDF ] | |
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