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PDF KAF-18500-NXA-08 Data sheet ( Hoja de datos )
| Número de pieza | KAF-18500-NXA-08 | |
| Descripción | CCD IMAGE SENSOR | |
| Fabricantes | ON Semiconductor | |
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KAF-18500
5270 (H) x 3516 (V) Full
Frame CCD Image Sensor
Description
The KAF−18500 is a dual output, high performance color CCD
(charge coupled device) image sensor with 5270 (H) x 3516 (V)
photoactive pixels designed for a wide range of color image sensing
applications including digital imaging. Each pixel contains
anti−blooming protection by means of a lateral overflow drain thereby
preventing image corruption during high light level conditions. Each
of the 6.8 mm square pixels are selectively covered with red, green or
blue pigmented filters for color separation. Microlenses are added for
improved sensitivity.
The sensor utilizes the TRUESENSE Transparent Gate Electrode to
improve sensitivity compared to the use of a standard front side
illuminated polysilicon electrode.
Table 1. GENERAL SPECIFICATIONS
Parameter
Architecture
Total Number of Pixels
Number of Effective Pixels
Number of Active Pixels
Pixel Size
Imager Size
Chip Size
Aspect Ratio
Saturation Signal
Charge to Voltage Conversion
Quantum Efficiency (RGB)
Read Noise (f = 24 MHz)
Dark Signal (T = 60°C)
Dark Current Doubling Temperature
Linear Dynamic Range (f = 24 MHz,
T = 60°C)
Charge Transfer Efficiency
(HCTE/VCTE)
Blooming Protection
(4 ms exposure time)
Maximum Data Rate
Readout Mode
Package
Cover Glass
Typical Value
Full Frame CCD with Square
Pixels
5422 (H) x 3610 (V) = 19.6 M
5310 (H) x 3556 (V) = 18.8 M
5270 (H) x 3516 (V) = 18.5 M
6.8 mm (H) x 6.8 mm (V)
43.1 mm (diagonal),
35 mm Optical format
37.8 mm (H) x 26.4 mm (V)
3:2
42 ke−
25 mV/e−
30%, 45%, 40%
15.7 e−
50 pA/cm2
5.3°C
68.1 dB
0.999995
0.999998
5600 X saturation exposure
24 MHz
Dual Output Only
PGA
AR coated (S8612)
NOTE: Unless otherwise noted, all parameters above are specified at
T = 20°C to 25°C.
www.onsemi.com
Figure 1. KAF−18500 CCD Image Sensor
Features
• TRUESENSE Transparent Gate Electrode
for High Sensitivity
• High Resolution, 35 mm Format
• Broad Dynamic Range
• Low Noise
• Large Image Area
Applications
• Digital Still Cameras
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2015
April, 2015 − Rev. 2
1
Publication Order Number:
KAF−18500/D
1 page  
Output Load
KAF−18500
VDD = +15 V
Iout = 5 mA
VOUT
140 W
2N3904
or Equiv.
1 kW
0.1 μF
Buffered
Video
Output
Note: Component values may be revised based on operating conditions and other design considerations.
Figure 4. Typical Output Structure Load Diagram
www.onsemi.com
5
5 Page 
KAF−18500
DEFECT DEFINITIONS
Operating Conditions
All defect tests performed at:
Table 9. OPERATING CONDITIONS
Description
Condition
Integration time (tint)
Varies per test: Bright Field 250 ms, Dark Field 1 sec, Saturation 250 ms,
Low light 33 ms
Horizontal clock frequency
24 MHz
Temperature
20 − 25°C
Notes
Room temperature
Table 10. SPECIFICATIONS
Classification
Standard Grade
Points
≤ 4400
Clusters, small
and large
≤ 50
Clusters, large
≤5
Columns
≤ 15
Includes Dead Columns
yes
Point Defects
A pixel that deviates by more than 9 mV above
neighboring pixels under non−illuminated conditions.
−or−
A pixel that deviates by more than 7% above or 11%
below neighboring pixels under illuminated conditions.
Cluster Defect
Small clusters: A grouping of adjacent point defects that
can number in size from 2 to 10 pixels.
Large clusters: A grouping of more than 10 pixels but not
larger than 20 adjacent point defects. A single large cluster
is not to exceed 5 adjacent pixels within the same color
plane.
Cluster Separation
Cluster defects are separated by no less than 4 good pixels
in any direction.
Column Defect
A grouping of more than 10 point defects along a single
column
−or−
A column that deviates by more than 0.9 mV above or
below neighboring columns under non−illuminated
conditions.
−or−
A column that deviates by more than 1.5% above or below
neighboring columns under illuminated conditions.
Column and cluster defects are separated by at least 4
good columns in the x direction. No multiple column defects
(double or more) will be permitted.
Dead Columns
A column that deviates by more than 50% below
neighboring columns under illuminated conditions.
Saturated Columns
A column that deviates by more than 100 mV above
neighboring columns under non−illuminated conditions. No
saturated columns are allowed.
www.onsemi.com
11
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